atf-331m4 Avago Technologies, atf-331m4 Datasheet - Page 3

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atf-331m4

Manufacturer Part Number
atf-331m4
Description
Low Noise Pseudomorphic Hemt In A Miniature Leadless Package
Manufacturer
Avago Technologies
Datasheet

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3
ATF-331M4 DC Electrical Specifications
T
Symbol Parameter and Test Condition
Idss
Vp
Id
Gm
Igdo
Igss
NF
Ga
OIP3
P1dB
Notes:
1. Guaranteed at wafer probe level
2. Typical values are determined from a sample size of 349 parts from 4 wafers.
3. Measurements obtained using production test board described in Figure 5.
Input
Figure 5. Block diagram of 2 GHz production test board used for Noise Figure, Associated Gain, P1dB, and OIP3 measurements. This circuit
represents a trade-off between an optimal noise match and a realizable match based on production test requirements. Circuit losses have been
de-embedded from actual measurements.
A
[1]
[1]
= 25°C, RF parameters measured in a test circuit for a typical device
[1]
Saturated Drain Current
Pinch-off Voltage
Quiescent Bias Current
Transconductance
Gate to Drain Leakage Current
Gate Leakage Current
Noise Figure
Associated Gain
Output 3
Intercept Point
1dB Compressed
Output Power
Transmission Line
(0.3 dB loss)
Gate Bias T
50Ω Input
Including
rd
Order
[3]
[3]
f = 900 MHz, 5 dBm Pout/Tone
f = 2 GHz, 5 dBm Pout/Tone
Matching Circuit
Γ_mag = 0.13
Γ_ang = 113°
(0.3 dB loss)
Input
f = 900 MHz
f = 900 MHz
f = 900 MHz
f = 2 GHz
f = 2 GHz
f = 2 GHz
Vds = 4 V, Ids = 60 mA
Vds = 1.5 V, Vgs = 0V
Vds = 1.5 V, Ids = 10% of Idss
Vgs = -0.51 V, Vds = 4V
Vds = 1.5 V, Gm = Idss/Vp
Vgd = -5 V
Vgd = Vgs = -4V
Vds = 4 V, Ids = 60 mA
Vds = 4 V, Ids = 60 mA
Vds = 4 V, Ids = 60 mA
Vds = 4 V, Ids = 60 mA
Vds = 4 V, Ids = 60 mA
Vds = 4 V, Ids = 60 mA
Vds = 4 V, Ids = 60 mA
DUT
Transmission Line
(0.5 dB loss)
Gate Bias T
50Ω Output
Including
Units
mA
V
mA
mmho
µA
µA
dB
dB
dB
dB
dBm
dBm
dBm
dBm
Output
Min.
175
-0.65
360
13.5
28.5
Typ.
237
-0.5
60
440
42
0.6
0.5
15
21
31
30.8
19
18
[2]
Max.
305
-0.35
1000
600
0.8
16.5

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