EL4331C Elantec Semiconductor, Inc. (acquired by Intersil), EL4331C Datasheet - Page 2

• Manufacturer Part Number: EL4331C
• Description: Triple 2:1 Mux-amp AV=1
• Manufacturer: Elantec Semiconductor, Inc. (acquired by Intersil)

EL4331C
Triple 2:1 Mux-Amp AV = 1
Absolute Maximum Ratings
V
V
V
Continuous Output Current
Any Input (except P
P
Important Note:
All parameters having Min/Max specifications are guaranteed. The Test Level column indicates the specific device testing actually performed during
production and Quality inspection. Elantec performs most electrical tests using modern high-speed automatic test equipment, specifically the LTX77
Series system. Unless otherwise noted, all tests are pulsed tests, therefor T
DC Electrical Characteristics
V
V
dV
I
dI
AV
PSRR
V
V
I
X
V
V
I
I
I
I
I
I
D
CC
CC
EE
CC
B
OUT
IL_AB
IH_AB
IL_PD
IH_PD
S
S(PD)
OS
OUT
OUT
TALK
IH
IL
1. Any channel’s A-input to its B-input.
2. There is no short circuit protection on any output.
Parameter
B
Input
Test Level
OS
OL
to Any GND
to V
to Any GND
= +5V, V
_500
_150
III
IV
II
V
I
EE
EE
= -5V, Ambient Temperature =25°C, R
Input Referred Offset Voltage
Input A to Input B Offset Voltage
Input Bias Current
Input A to Input B Bias Current
Open Loop Gain (from Gain Error Calculation)
Power Supply Rejection Ratio
Output Voltage Swing into 500 Load
Output Voltage Swing into 150 Load
Current Output, Measured with 75 load
Crosstalk from Non-Selected Input (at DC)
Input Logic High Level (A/B and PD)
Input Logic Low Level (A/B and PD)
Logic Low Input Current (V
Logic High Input Current (V
Logic Low Input Current (V
Logic High Input Current (V
Total Supply Current
Powered Down Supply Current
D
Test Procedure
100% production tested and QA sample tested per QA test plan QCX0002.
100% production tested at T
QA sample tested per QA test plan QCX0002.
Parameter is guaranteed (but not tested) by Design and Characterization Data.
Parameter is typical value at T
)
Description
IN
IN
IN
IN
A
= 0.8V), A/B Pin
= 0.8V), PD Pin
= 2.0V), A/B Pin
= 5.0V), PD Pin
A
= 25°C and QA sample tested at T
[1]
= 25°C for information purposes only.
[1]
V
V
EE
(T
CC
-0.3V to V
A
L
-7V to V
[2]
= 25 °C)
= 500 , P
CC
CC
45 mA
+0.3V
+0.3V
D
14V
12V
12V
= 5V
J
= T
2
C
A
Input Current, Any Input
Power Dissipation
Operating Temperature
Leading Temperature during Soldering
Junction Temperature
Storage Temperature
= T
= 25°C, T
A
.
Min
±2.7
-70
2.0
-10
0.5
60
30
38
-1
-5
MAX
and T
+3/-2.7
MIN
Typ
±3.2
0.01
-12
-85
-20
0.5
1.0
54
70
40
48
-7
1
0
0
per QA test plan QCX0002.
Max
-100
-30
4.0
0.8
1.6
1.0
30
10
60
8
5
Test Level
II
II
II
II
V
II
II
V
II
II
II
II
II
II
II
II
II
II
-60°C to +150°C
-45°C to +85°C
See curves
Units
mV
mV
mA
mA
mA
mA
µA
µA
dB
dB
dB
µA
µA
µA
V
V
V
V
300°C
170°C
5 mA