74AUP2G38GM,125 NXP Semiconductors, 74AUP2G38GM,125 Datasheet - Page 10

IC NAND GATE DL 2-IN 8-XQFN

74AUP2G38GM,125

Manufacturer Part Number
74AUP2G38GM,125
Description
IC NAND GATE DL 2-IN 8-XQFN
Manufacturer
NXP Semiconductors
Series
74AUPr
Datasheet

Specifications of 74AUP2G38GM,125

Number Of Circuits
2
Package / Case
8-XQFN
Logic Type
NAND Gate with Open Drain
Number Of Inputs
2
Current - Output High, Low
4mA, 4mA
Voltage - Supply
0.8 V ~ 3.6 V
Operating Temperature
-40°C ~ 125°C
Mounting Type
Surface Mount
Logic Family
AUP
Low Level Output Current
4 mA
Propagation Delay Time
19.5 ns
Supply Voltage (max)
3.6 V
Supply Voltage (min)
0.8 V
Maximum Operating Temperature
+ 125 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 40 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
74AUP2G38GM-G
74AUP2G38GM-G
935281427125
NXP Semiconductors
Table 10.
[1]
74AUP2G38
Product data sheet
Supply voltage
V
0.8 V to 3.6 V
Fig 9.
CC
For measuring enable and disable times R
For measuring propagation delays, set-up times, hold times and pulse width, R
Test data is given in
Definitions for test circuit:
R
C
R
V
Test circuit for measuring switching times
L
L
T
EXT
Test data
= Load resistance.
= Load capacitance including jig and probe capacitance.
= Termination resistance should be equal to the output impedance Z
= External voltage for measuring switching times.
Load
C
5 pF, 10 pF, 15 pF and 30 pF
L
Table
10.
L
All information provided in this document is subject to legal disclaimers.
G
= 5 kΩ.
Rev. 5 — 23 September 2010
V I
R T
R
5 kΩ or 1 MΩ
L
DUT
V
[1]
CC
V O
Low-power dual 2-input NAND gate; open drain
C L
o
L
001aac521
of the pulse generator.
= 1 MΩ.
V
t
open
V
PLH
EXT
EXT
5 kΩ
R L
, t
PHL
t
GND
PZH
74AUP2G38
, t
PHZ
© NXP B.V. 2010. All rights reserved.
t
2V
PZL
CC
, t
PLZ
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