STQ-1016Z ETC1 [List of Unclassifed Manufacturers], STQ-1016Z Datasheet - Page 3

• Manufacturer Part Number: STQ-1016Z
• Description: Reliability Qualification Report
• Manufacturer: ETC1 [List of Unclassifed Manufacturers]

STQ-2016Z Reliability Qualification Report
V. Qualification Methodology
The Sirenza Microdevices qualification process consists of a series of tests designed to
stress various potential failure mechanisms. This testing is performed to ensure that
Sirenza Microdevices products are robust against potential failure modes that could arise
from the various die and package failure mechanisms stressed. The qualification testing
is based on JESD test methods common to the semiconductor industry. The
manufacturing test specifications are used as the PASS/FAIL criteria for initial and final
DC/RF tests.
VI. Qualification By Similarity
A device can be qualified by similarity to previously qualified products provided that no
new potential failure modes/mechanisms are possible in the new design. The following
products have been qualified by similarity to STQ-2016Z:
STQ-1016Z STQ-3016Z SRF-1016Z SRF-2016Z SRQ-2116Z
VII. Operational Life Testing
Sirenza Microdevices defines operational life testing as a DC biased elevated
temperature test performed at the maximum operational junction temperature limit. For
o
the STQ-2016Z the maximum operational temperature limit is 150
C. The purpose of the
operational life test is to statistically show that the product operated at its maximum
operational ratings will be reliable by operating several hundred devices for a total time of
1000 hours. The results for this test are expressed in device hours that are calculated by
multiplying the total number of devices passing the test by the number of hours tested.