CAT1161LI-30T2 CATALYST [Catalyst Semiconductor], CAT1161LI-30T2 Datasheet - Page 2

• Manufacturer Part Number: CAT1161LI-30T2
• Description: Supervisory Circuits with I2C Serial CMOS EEPROM, Precision Reset Controller and Watchdog Timer
• Manufacturer: CATALYST [Catalyst Semiconductor]

CAT1161, CAT1162
BLOCK DIAGRAM
EXTERNA L LOAD
V CC
GND
SDA
ABSOLUTE MAXIMUM RATINGS
REABILITY CHARACTERISTICS
Notes:
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings
(2) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20ns. Maximum DC
(3) Output shorted for no more than one second. No more than one output shorted at a time.
(4) This parameter is tested initially and after a design or process change that affects the parameter.
(5) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V
Doc. No. 3002 Rev. F
WP
CAT1161
Only for
Parameters
Temperature Under Bias
Storage Temperature
Voltage on any Pin with Respect to Ground
V
Package Power Dissipation Capability (T
Lead Soldering Temperature (10 secs)
Output Short Circuit Current
Symbol
CC
I
N
V
only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this
specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
voltage on output pins is V
LTH
T
END
ZAP
DR
with Respect to Ground
(4)(5)
(4)
(4)
(4)
START/STOP
WATCHDOG
CONTR OL
LOGIC
WORDADDRESS
LOGIC
RESET Controller
Parameter
Endurance
Data Retention
ESD Susceptibility
Latch-up
BUFFERS
D OUT
ACK
RESET RESET
Vcc Monitor
Precision
XDEC
CC
+0.5V, which may overshoot to V
(3)
SHIFT REGISTERS
STATE COUNTERS
SLAVE
ADDRESS
COMPARATORS
DATA IN STORAGE
TIMING CONTR OL
HIGHVOLTAGE/
SENSEAMPS
DECODERS
COLUMN
(1)
EEPROM
16K
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
A
= 25°C)
(2)
Reference Test Method
JEDEC Standard 17
SCL
CC
+2.0V for periods of less than 20 ns.
2
RESET THRESHOLD OPTION
Part Dash
Number
-45
-42
-30
-28
-25
1,000,000
2000
Min
100
100
CC
–2.0 to V
+1V.
–55 to +125
–65 to +150
Characteristics subject to change without notice
–2.0 to 7.0
Threshold
Minimum
Ratings
300
100
1.0
4.50
4.25
3.00
2.85
2.55
CC
© 2007 Catalyst Semiconductor, Inc.
Max
+ 2.0
Cycles/Byte
Threshold
Maximum
Years
Units
Volts
4.75
4.50
3.15
3.00
2.70
mA
Units
mA
ºC
ºC
ºC
W
V
V