MC9S12A128 MOTOROLA [Motorola, Inc], MC9S12A128 Datasheet - Page 60

• Manufacturer Part Number: MC9S12A128
• Description: Microcontroller unit (MCU)
• Manufacturer: MOTOROLA [Motorola, Inc]

A.1.6 ESD Protection and Latch-up Immunity
All ESD testing is in conformity with CDF-AEC-Q100 Stress test qualification for Automotive Grade
Integrated Circuits. During the device qualification ESD stresses were performed for the Human Body
Model (HBM), the Machine Model (MM) and the Charge Device Model.
A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification. Complete DC parametric and functional testing is performed per the applicable device
specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.
Human Body
Machine
Latch-up
Num C
1
2
3
4
5
Model
C Human Body Model (HBM)
C Machine Model (MM)
C Charge Device Model (CDM)
C
C
Latch-up Current at T
positive
negative
Latch-up Current at T
positive
negative
Series Resistance
Storage Capacitance
Number of Pulse per pin
positive
negative
Series Resistance
Storage Capacitance
Number of Pulse per pin
positive
negative
Minimum input voltage limit
Maximum input voltage limit
Table A-3 ESD and Latch-Up Protection Characteristics
Table A-2 ESD and Latch-up Test Conditions
A
A
= 125 C
= 27 C
Rating
Description
Symbol
V
V
V
I
I
HBM
CDM
LAT
LAT
MM
MC9S12A128 Device Guide — V01.01
Symbol
R1
R1
—
—
—
—
—
—
2000
+100
–100
+200
–200
C
C
Min
200
500
Value
1500
–2.5
100
200
7.5
Max
3
3
0
3
3
—
—
—
—
—
—
—
Unit
Ohm
Ohm
Unit
mA
mA
pF
pF
V
V
V
V
V
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