EL2257C Elantec Semiconductor, EL2257C Datasheet - Page 2

• Manufacturer Part Number: EL2257C
• Description: 125 MHz Single Supply/ Clamping Op Amps
• Manufacturer: Elantec Semiconductor

EL2257C/EL2357C
125 MHz Single Supply, Clamping Op Amps
Absolute Maximum Ratings
Supply Voltage between V
Input Voltage (IN+, IN-, ENABLE, CLAMP)
Differential Input Voltage
Maximum Output Current
Output Short Circuit Duration
Important Note:
All parameters having Min/Max specifications are guaranteed. The Test Level column indicates the specific device testing actually performed during
production and Quality inspection. Elantec performs most electrical tests using modern high-speed automatic test equipment, specifically the LTX77
Series system. Unless otherwise noted, all tests are pulsed tests, therefor T
DC Electrical Characteristics
V
V
TCV
IB
I
TCI
PSRR
CMRR
CMIR
R
C
R
I
I
PSOR
AVOL
S
Parameter
OS
S,ON
S,OFF
=+5V, GND=0V, T
OS
IN
IN
OUT
Test Level
OS
OS
III
IV
II
V
I
Offset Voltage
Offset Voltage Temperature Coefficient
Input Bias Current
Input Offset Current
Input Bias Current Temperature Coefficient
Power Supply Rejection Ratio
Common Mode Rejection Ratio
Common Mode Input Range
Input Resistance
Input Capacitance
Output Resistance
Supply Current - Enabled (per amplifier)
Supply Current - Shut Down (per amplifier)
Power Supply Operating Range
Open Loop Gain
Test Procedure
100% production tested and QA sample tested per QA test plan QCX0002.
100% production tested at T
QA sample tested per QA test plan QCX0002.
Parameter is guaranteed (but not tested) by Design and Characterization Data.
Parameter is typical value at T
A
=25°C, V
S
and GND
Description
CM
(see note
=1.5V, V
[1]
OUT
DC Electrical Characteristics)
A
A
= 25°C and QA sample tested at T
=1.5V, V
= 25°C for information purposes only.
GND–0.3V, V
(T
A
= 25 °C)
CLAMP
EL2257C
EL2357C
Measured from Tmin to Tmax
V
V
Measured from Tmin to Tmax
V
V
VCM=0V to +3.8V
VCM=0V to +3.0V
Common Mode
SOIC Package
PDIP Package
Av=+1
V
V
V
V
R
V
V
L
OUT
OUT
IN
IN
S
CLAMP
S
S
S
S
=+5V, V
=V
=V
=V
=V
=V
=1 k to GND
=0V
=0V
S
90 mA
=+1.5V to +3.5V, R
=+1.5V to +3.5V, R
ENABLE
CLAMP
CLAMP
CLAMP
CLAMP
+0.3V
12.6V
±6V
=OPEN
ENABLE
Test Conditions
J
=+12V, V
=+10V, V
=+12V, V
=+12V, V
=+2.7V to +12V,
= T
2
C
A
Power Dissipation
Storage Temperature Range
Ambient Operating Temperature Range
Operating Junction Temperature
=+5V, unless otherwise specified.
= T
= 25°C, T
OUT
ENABLE
ENABLE
ENABLE
A
.
L
L
=+2V to +9V,
=1 k to GND
=150 to GND
=+12V
=+0.5V
=+0.5V
MAX
and T
MIN
-1100
Min
per QA test plan QCX0002.
2.7
45
50
55
65
-4
-6
0
1
Typ
-5.5
150
1.5
10
50
70
65
70
40
80
70
60
2
1
5
0
5
V
+1100
Max
12.0
-10
S
6.5
50
4
6
-1.2
Level
Test
-65°C to +150°C
V
V
V
V
V
V
V
V
I
I
I
I
I
I
I
I
I
I
I
I
I
-40°C to +85°C
See Curves
µV/°C
nA/°C
Units
M
mV
mV
m
mA
µA
nA
dB
dB
dB
µA
µA
dB
dB
dB
150°C
pF
pF
V
V