SAA5290ZP Philips Semiconductors, SAA5290ZP Datasheet - Page 7

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SAA5290ZP

Manufacturer Part Number
SAA5290ZP
Description
One page Economy Teletext/TV microcontroller
Manufacturer
Philips Semiconductors
Datasheet

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Philips Semiconductors
QUALITY AND RELIABILITY
This device will meet Philips Semiconductors General Quality Specification for Business group “Consumer Integrated
Circuits SNW-FQ-611-Part E” (see “Quality Reference Handbook” , order number 9398 510 63011). The principal
requirements are shown in Tables 1 to 4.
Group A
Table 1 Acceptance tests per lot
Group B
Table 2 Processability tests (by package family)
Group C
Table 3 Reliability tests (by process family)
Table 4 Reliability tests (by device type)
Notes to Tables 1 to 4
1. ppm = fraction of defective devices, in parts per million.
February 1995
Mechanical
Electrical
Solderability
Mechanical
Solder heat resistance
Operational life
Humidity life
Temperature cycling performance
ESD and latch-up
One page Economy Teletext/TV
microcontroller
LTPD = Lot Tolerance Percent Defective.
FPM = fraction of devices failing at test condition, in Failures Per Million.
FITS = Failures In Time Standard.
TEST
TEST
TEST
TEST
cumulative target: 80 ppm
cumulative target: 80 ppm
168 hours at T
temperature, humidity, bias
1000 hours, 85 C, 85% RH
(or equivalent test)
T
ESD Human body model
2000 V, 100 pF, 1.5 k
ESD Machine model
200 V, 200 pF, 0
latch-up 100 mA, 1.5
(absolute maximum)
7% LTPD
15% LTPD
15% LTPD
stg(min)
to T
stg(max)
CONDITIONS
CONDITIONS
j
= 150 C
7
V
DD
REQUIREMENTS
REQUIREMENTS
1500 FPM; equivalent to
100 FITS at T
2000 FPM
2000 FPM
15% LTPD
15% LTPD
15% LTPD
(1)
(1)
REQUIREMENTS
REQUIREMENTS
Preliminary specification
j
= 70 C
SAA5290
(1)
(1)

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