TH50VSF3582AASB TOSHIBA [Toshiba Semiconductor], TH50VSF3582AASB Datasheet - Page 16
TH50VSF3582AASB
Manufacturer Part Number
TH50VSF3582AASB
Description
TOSHIBA MULTI-CHIP INTEGRATED CIRCUIT SILICON GATE CMOS
Manufacturer
TOSHIBA [Toshiba Semiconductor]
Datasheet
1.TH50VSF3582AASB.pdf
(50 pages)
- Current page: 16 of 50
- Download datasheet (539Kb)
AC CHARACTERISTICS
AC TEST CONDITIONS
Read cycle
t
t
t
t
t
t
t
t
t
t
t
t
t
t
Write cycle
t
t
t
t
t
t
t
t
t
t
Input Pulse Level
Input Pulse Rise and Fall Time (10%~90%)
Timing Measurement Reference Level (input)
Timing Measurement Reference Level (output)
Output Load
RC
ACC
CO1
CO2
OE
BA
COE
OEE
BE
OD
ODO
BD
OH
CCR
WC
WP
CW
BW
AS
WR
ODW
OEW
DS
DH
SYMBOL
SYMBOL
Read Cycle Time
Address Access Time
Chip Enable (
Chip Enable (CE2S) Access Time
Output Enable Access Time
Data Byte Control Access Time
Chip Enable Low to Output Active
Output Enable Low to Output Active
Data Byte Control Low to Output Active
Chip Enable High to Output Hi-Z
Output Enable High to Output Hi-Z
Data Byte Control High to Output Hi-Z
Output Data Hold Time
CE Recovery Time
Write Cycle Time
Write Pulse Width
Chip Enable to End of Write
Data Byte Control to End of Write
Address Set-up Time
Write Recovery Time
Data Set-up Time
Data Hold Time
WE Low to Output Hi-Z
WE High to Output Active
PARAMETER
CE
1
S
(SRAM) (Ta = = = = -40°~85°C, V
) Access Time
PARAMETER
PARAMETER
CCs
= = = = 2.7 V~3.6 V)
TH50VSF3582/3583AASB
C
L
(100 pF) + 1 TTL gate
0.4 V, 2.4 V
V
V
MIN
MIN
VALUES
70
10
70
50
60
50
30
CCs
CCs
5
0
0
0
0
0
0
0
5 ns
× 0.5
× 0.5
2001-06-08 16/50
MAX
MAX
70
70
70
35
35
30
30
30
30
UNIT
UNIT
ns
ns
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