HS9-1840ARH/PROTO INTERSIL [Intersil Corporation], HS9-1840ARH/PROTO Datasheet - Page 4

• Manufacturer Part Number: HS9-1840ARH/PROTO
• Description: Rad-Hard 16 Channel CMOS Analog Multiplexer with High-Z Analog Input Protection
• Manufacturer: INTERSIL [Intersil Corporation]

Burn-In/Life Test Circuits
NOTES:
Irradiation Circuit
NOTE:
FIGURE 1. DYNAMIC BURN-IN AND LIFE TEST CIRCUIT
+V
GND
1. The above test circuits are utilized for all package types.
2. The Dynamic Test Circuit is utilized for all life testing.
3. All irradiation testing is performed in the 28 lead CERDIP package.
F4
NOTE:
V
R = 1kΩ ±5%.
C
D
INPUT SIGNALS:
SQUARE WAVE, 50% DUTY CYCLE, 0V TO 15V PEAK ±10%.
F1 = 100kHz; F2 = F1/2; F3 = F1/4; F4 = F1/8; F5 = F1/16.
S
1
1
S
+ = +15.5V ±0.5V, V
= C
= D
2
2
= 0.01µF ±10%, 1 EACH PER SOCKET, MINIMUM.
= 1N4002, 1 EACH PER BOARD, MINIMUM.
R
S
- = -15.5V ±0.5V.
10
11
12
13
14
1
2
3
4
5
6
7
8
9
4
+15V
28
27
26
25
24
23
22
21
20
19
18
17
16
15
+1V
+5V
HS-1840ARH, HS-1840BRH
NC
NC
R
R
HS-1840ARH, HS-1840BRH
F1
F3
10
11
12
13
14
1
2
3
4
5
6
7
8
9
-V
F5
F2
S
+V
V
GND
R
S
NOTE:
R = 1kΩ ±5%, 1/4W.
C
V
FIGURE 2. .STATIC BURN-IN TEST CIRCUIT
28
27
26
25
24
23
22
21
20
19
18
17
16
15
S
1
+ = 15.5V ±0.5V, V
= C
R
2
= 0.01µF MINIMUM, 1 EACH PER SOCKET, MINIMUM.
R
-15V
10
11
12
13
14
1
2
3
4
5
6
7
8
9
S
- = -15.5V ±0.5V, V
1kΩ
R
28
27
26
25
24
23
22
21
20
19
18
17
16
15
= 15.5 ±0.5V
R
September 14, 2010
R
FN4355.3
-V
S