LIS302DL_07 STMICROELECTRONICS [STMicroelectronics], LIS302DL_07 Datasheet - Page 10

• Manufacturer Part Number: LIS302DL_07
• Manufacturer: STMICROELECTRONICS [STMicroelectronics]

Mechanical and electrical specifications
2
2.1
Table 3.
1. The product is factory calibrated at 2.5V. The device can be used from 2.16V to 3.6V
2. All the parameters are specified @ Vdd=2.5V, T = 25°C unless otherwise noted
3. Typical specifications are not guaranteed
4. Verified by wafer level test and measurement of initial offset and sensitivity
5. Typical zero-g level offset value after MSL3 preconditioning
6. Offset can be eliminated by enabling the built-in high pass filter
7. If STM bit is used values change in sign for all axes
8. Self Test output changes with the power supply. “Self test output change” is defined as OUTPUT[LSb]
9. Output data reach 99% of final value after 3/ODR when enabling Self-Test mode due to device filtering
10. ODR is output data rate. Refer to
10/42
Symbol
TCSO
TCOff
TyOff
-OUTPUT[LSb]
BW
Top
Wh
Vst
FS
So
Measurement range
Sensitivity
Sensitivity change vs
temperature
Typical zero-g level offset
accuracy
Zero-g level change vs
temperature
Self test output
change
System bandwidth
Operating temperature range
Product weight
Mechanical and electrical specifications
Mechanical characteristics
Mechanical characteristics
(Self-test bit on ctrl_reg1=0)
(7),(8),(9)
(5),(6)
Parameter
(10)
(4)
Table 4
. 1LSb=4.6g/256 at 8bit representation,
for specifications
FS bit set to 0
FS bit set to 1
FS bit set to 0
FS bit set to 1
FS bit set to 0
FS bit set to 0
FS bit set to 1
Max delta from 25°C
FS bit set to 0
STP bit used
X axis
Vdd=2.16V to 3.6V
FS bit set to 0
STP bit used
Y axis
Vdd=2.16V to 3.6V
FS bit set to 0
STP bit used
Z axis
Vdd=2.16V to 3.6V
(1) (2)
Test conditions
±
2.3g Full-Scale
Min.
16.2
64.8
±2.0
±8.0
-16
-40
3
3
Typ.
ODR/2
±0.01
±2.3
±9.2
±0.5
±60
±40
18
72
30
(Self-test bit on ctrl_reg1=1)
(3)
Max.
19.8
79.2
+85
16
16
-3
LIS302DL
mg/digit
mgram
mg/°C
%/°C
Unit
LSb
LSb
LSb
mg
mg
Hz
°C
g