HCTS245D INTERSIL [Intersil Corporation], HCTS245D Datasheet

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HCTS245D

Manufacturer Part Number
HCTS245D
Description
Radiation Hardened Octal Bus Transceiver, Three-State, Non-Inverting
Manufacturer
INTERSIL [Intersil Corporation]
Datasheet

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
HCTS245DMSR
Manufacturer:
S/PHI
Quantity:
7
September 1995
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
http://www.intersil.com or 407-727-9207
Features
• 3 Micron Radiation Hardened CMOS SOS
• Total Dose 200K RAD (Si)
• SEP Effective LET No Upsets: >100 MEV-cm
• Single Event Upset (SEU) Immunity < 2 x 10
• Dose Rate Survivability: >1 x 10
• Dose Rate Upset >10
• Latch-Up Free Under Any Conditions
• Fanout (Over Temperature Range)
• Military Temperature Range: -55
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• LSTTL Input Compatibility
• Input Current Levels Ii
Description
The Intersil HCTS245MS is a Radiation Hardened Non-
Inverting Octal Bidirectional Bus Transceiver, Three-State,
intended for two-way asynchronous communication between
data busses. The HCTS245MS allows data transmission
from the A bus to the B bus or from the B bus to the A bus.
The logic level at the direction input (DIR) determines the
data direction. The output enable input (OE) puts the I/O port
in the high-impedance state when high.
The HCTS245MS utilizes advanced CMOS/SOS technology
to achieve high-speed operation. This device is a member of
radiation hardened, high-speed, CMOS/SOS Logic Family.
The HCTS245MS is supplied in a 20 lead Ceramic flatpack
(K suffix) or a SBDIP Package (D suffix).
Ordering Information
HCTS245DMSR
HCTS245KMSR
HCTS245D/Sample
HCTS245K/Sample
HCTS245HMSR
Bit-Day (Typ)
- Bus Driver Outputs - 15 LSTTL Loads
- VIL = 0.8V Max
- VIH = VCC/2 Min
PART NUMBER
10
RAD (Si)/s 20ns Pulse
5 A at VOL, VOH
|
Copyright
TEMPERATURE RANGE
12
o
C to +125
©
-55
-55
RAD (Si)/s
Intersil Corporation 1999
o
o
C to +125
C to +125
+25
+25
+25
Octal Bus Transceiver, Three-State, Non-Inverting
o
o
o
o
C
C
C
C
2
/mg
-9
o
o
C
C
Errors/
614
Pinouts
Intersil Class S Equivalent
Intersil Class S Equivalent
Sample
Sample
Die
HCTS245MS
GND
DIR
SCREENING LEVEL
A0
A1
A2
A3
A4
A5
A6
A7
FLATPACK PACKAGE (FLATPACK)
20 LEAD CERAMIC DUAL-IN-LINE
20 LEAD CERAMIC METAL SEAL
METAL SEAL PACKAGE (SBDIP)
GND
DIR
A0
A1
A2
A3
A4
A5
A6
A7
MIL-STD-1835 CDFP4-F20
MIL-STD-1835 CDIP2-T20
10
1
2
3
4
5
6
7
8
9
1
2
3
4
5
6
7
8
9
10
TOP VIEW
TOP VIEW
Radiation Hardened
20 Lead SBDIP
20 Lead Ceramic Flatpack
20 Lead SBDIP
20 Lead Ceramic Flatpack
Die
20
19
18
17
16
15
14
13
12
11
20
19
18
17
16
15
14
13
12
11
Spec Number
File Number
PACKAGE
VCC
OE
B0
B1
B2
B3
B4
B5
B6
B7
518615
VCC
OE
B0
B1
B2
B3
B4
B5
B6
B7
2360.2

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HCTS245D Summary of contents

Page 1

... The HCTS245MS is supplied lead Ceramic flatpack (K suffi SBDIP Package (D suffix). Ordering Information PART NUMBER TEMPERATURE RANGE HCTS245DMSR HCTS245KMSR HCTS245D/Sample HCTS245K/Sample HCTS245HMSR CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. | http://www.intersil.com or 407-727-9207 Copyright HCTS245MS ...

Page 2

Functional Diagram B DATA 11 (18, 17, 16, 15, 14, 13, 12) DIR 1 OUTPUT ENABLE High Voltage Level Low Voltage Level Immaterial To prevent excess currents in the ...

Page 3

Absolute Maximum Ratings Supply Voltage (VCC -0.5V to +7.0V Input Voltage Range, All Inputs . . ...

Page 4

TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS PARAMETER SYMBOL Propagation Delay TPLH VCC = 4.5V Data to Output TPHL VCC = 4.5V Enable to Output TPZL VCC = 4.5V TPZH VCC = 4.5V Disable to Output TPLZ VCC = 4.5V TPHZ ...

Page 5

TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS PARAMETER SYMBOL Quiescent Current ICC VCC = 5.5V, VIN = VCC or GND Output Current (Sink) IOL VCC = 4.5V, VIN = VCC or GND, VOUT = 0.4V Output Current IOH VCC ...

Page 6

CONFORMANCE GROUPS Initial Test (Preburn-In) Interim Test I (Postburn-In) Interim Test II (Postburn-In) PDA Interim Test III (Postburn-In) PDA Final Test Group A (Note 1) Group B Subgroup B-5 Subgroup B-6 Group D NOTE: 1. Alternate Group A Testing in ...

Page 7

Intersil Space Level Product Flow - ‘MS’ Wafer Lot Acceptance (All Lots) Method 5007 (Includes SEM) GAMMA Radiation Verification (Each Wafer) Method 1019, 4 Samples/Wafer, 0 Rejects 100% Nondestructive Bond Pull, Method 2023 Sample - Wire Bond Pull Monitor, Method ...

Page 8

Three-State Low Timing Diagrams VIH INPUT VS VIL TPZL VOZ VT OUTPUT VOL THREE-STATE LOW VOLTAGE LEVELS PARAMETER HCTS VCC 4.50 VIH 3.00 VS 1.30 VT 1.30 VW 0.90 GND 0 Three-State High Timing Diagrams VIH INPUT VS VIL TPZH ...

Page 9

Die Characteristics DIE DIMENSIONS: 124 x 110 mils METALLIZATION: Type: SiAl Å Å Metal Thickness: 11k 1k GLASSIVATION: Type: SiO 2 Å Å Thickness: 13k 2.6k WORST CASE CURRENT DENSITY <2 A/cm BOND PAD SIZE: 100 ...

Page 10

All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification. Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, ...

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