HCTS541HMSR INTERSIL [Intersil Corporation], HCTS541HMSR Datasheet

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HCTS541HMSR

Manufacturer Part Number
HCTS541HMSR
Description
Radiation Hardened Non-Inverting Octal Buffer/Line Driver, Three-State
Manufacturer
INTERSIL [Intersil Corporation]
Datasheet
August 1995
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
Features
• 3 Micron Radiation Hardened CMOS SOS
• Total Dose 200K RAD (Si)
• SEP Effective LET No Upsets: >100 MEV-cm
• Single Event Upset (SEU) Immunity < 2 x 10
• Dose Rate Survivability: >1 x 10
• Dose Rate Upset >10
• Latch-Up Free Under Any Conditions
• Fanout (Over Temperature Range)
• Military Temperature Range: -55
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• LSTTL Input Compatibility
• Input Current Levels Ii
Description
The Intersil HCTS541MS is a Radiation Hardened non-
inverting octal buffer/line driver, three-state outputs. The
output enable pins (OEN1 and OEN2) control the three-state
outputs. If either enable is high the outputs will be in the high
impedance state. For data output both enables (OEN1 and
OEN2) must be low.
The HCTS541MS utilizes advanced CMOS/SOS technology
to achieve high-speed operation. This device is a member of
radiation hardened, high-speed, CMOS/SOS Logic Family.
The HCTS54 is supplied in a 20 lead Ceramic flatpack
(K suffix) or a SBDIP Package (D suffix).
Ordering Information
HCTS541DMSR
HCTS541KMSR
HCTS541D/Sample
HCTS541K/Sample
HCTS541HMSR
Bit-Day (Typ)
- Bus Driver Outputs - 15 LSTTL Loads
- VIL = 0.8V Max
- VIH = VCC/2 Min
PART NUMBER
10
RAD (Si)/s 20ns Pulse
5 A at VOL, VOH
TEMPERATURE RANGE
12
o
C to +125
RAD (Si)/s
-55
-55
o
o
C to +125
C to +125
+25
+25
+25
o
o
o
o
C
C
C
C
2
/mg
-9
o
o
C
C
Errors/
682
Pinouts
Intersil Class S Equivalent
Intersil Class S Equivalent
Sample
Sample
Die
HCTS541MS
Octal Buffer/Line Driver, Three-State
GND
OE1
A0
A1
A2
A3
A4
A5
A6
A7
SCREENING LEVEL
Radiation Hardened Non-Inverting
FLATPACK PACKAGE (FLATPACK)
20 LEAD CERAMIC DUAL-IN-LINE
20 LEAD CERAMIC METAL SEAL
METAL SEAL PACKAGE (SBDIP)
GND
OE1
A0
A1
A2
A3
A4
A5
A6
A7
MIL-STD-1835 CDFP4-F20
MIL-STD-1835 CDIP2-T20
10
1
2
3
4
5
6
7
8
9
1
2
3
4
5
6
7
8
9
10
TOP VIEW
TOP VIEW
20 Lead SBDIP
20 Lead Ceramic Flatpack
20 Lead SBDIP
20 Lead Ceramic Flatpack
Die
20
19
18
17
16
15
14
13
12
11
20
19
18
17
16
15
14
13
12
Spec Number
11
File Number
PACKAGE
VCC
OE2
Y0
Y1
Y2
Y3
Y4
Y5
Y6
Y7
518630
VCC
OE2
Y0
Y1
Y2
Y3
Y4
Y5
Y6
Y7
3073.1

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HCTS541HMSR Summary of contents

Page 1

... SBDIP Package (D suffix). Ordering Information PART NUMBER TEMPERATURE RANGE HCTS541DMSR HCTS541KMSR HCTS541D/Sample HCTS541K/Sample HCTS541HMSR CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999 HCTS541MS Radiation Hardened Non-Inverting Octal Buffer/Line Driver, Three-State Pinouts 2 ...

Page 2

Functional Block Diagram TTL 2 TTL 3 TTL 4 TTL 5 TTL 6 TTL 7 TTL 8 TTL 1 19 TTL OE1 High Voltage Level Low Voltage Level Immaterial, Z ...

Page 3

Absolute Maximum Ratings Supply Voltage (VCC -0.5 to +7.0V Input Voltage Range, All Inputs . ...

Page 4

TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS PARAMETER SYMBOL Data to Output TPHL, VCC = 4.5V TPLH VCC = 4.5V Enable to Output TPZL VCC = 4.5V TPZH VCC = 4.5V Disable to Output TPLZ VCC = 4.5V TPHZ VCC = ...

Page 5

TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS PARAMETER SYMBOL Quiescent Current ICC VCC = 5.5V, VIN = VCC or GND Output Current (Sink) IOL VCC = 4.5V, VIN = VCC or GND, VOUT = 0.4V Output Current IOH VCC ...

Page 6

CONFORMANCE GROUPS Initial Test (Preburn-In) Interim Test I (Postburn-In) Interim Test II (Postburn-In) PDA Interim Test III (Postburn-In) PDA Final Test Group A (Note 1) Group B Subgroup B-5 Subgroup B-6 Group D NOTE: 1. Alternated Group A Inspection in ...

Page 7

Intersil Space Level Product Flow - ‘MS’ Wafer Lot Acceptance (All Lots) Method 5007 (Includes SEM) GAMMA Radiation Verification (Each Wafer) Method 1019, 4 Samples/Wafer, 0 Rejects 100% Nondestructive Bond Pull, Method 2023 Sample - Wire Bond Pull Monitor, Method ...

Page 8

AC Timing Diagrams VIH INPUT VS VIL TPLH VOH VS OUTPUT VOL TTLH VOH 80% 20% OUTPUT VOL AC VOLTAGE LEVELS PARAMETER HCTS VCC 4.50 VIH 3.00 VS 1.30 VIL 0 VSS 0 Three-State Low Timing Diagrams VIH INPUT VS ...

Page 9

Three-State High Timing Diagrams VIH INPUT VS VIL TPZH VOH VT OUTPUT VOZ THREE-STATE HIGH VOLTAGE LEVELS PARAMETER HCTS VCC 4.50 VIH 3.00 VS 1.30 VT 1.30 VW 3.60 GND 0 All Intersil semiconductor products are manufactured, assembled and tested ...

Page 10

Die Characteristics DIE DIMENSIONS: 101 x 85 mils METALLIZATION: Type: SiAl Å Å Metal Thickness: 11k 1k GLASSIVATION: Type: SiO 2 Å Å Thickness: 13k 2.6k WORST CASE CURRENT DENSITY <2 A/cm BOND PAD SIZE: 100 ...

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