ISPLSI5384VA-125LB272 Lattice Semiconductor, ISPLSI5384VA-125LB272 Datasheet - Page 11

• Manufacturer Part Number: ISPLSI5384VA-125LB272
• Manufacturer: Lattice Semiconductor

1. I/O voltage configuration must be set to VCC.
Output Load Conditions (See figure 8)
3-state levels are measured 0.5V from steady-state
active level.
Switching Test Conditions
DC Electrical Characteristics for 3.3V Range
V
V
V
V
V
C
SYMBOL
A
B
D
Input Pulse Levels
Input Rise and Fall Time
Input Timing Reference Levels
Ouput Timing Reference Levels
Output Load
TEST CONDITION
CCIO
IL
IH
OL
OH
Active High
Active Low
Active High to Z
at V -0.5V
Active Low to Z
at V +0.5V
Slow Slew
OH
OL
I/O Reference Voltage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
316Ω
316Ω
316Ω
R1
PARAMETER
∞
∞
∞
3.3V
348Ω
348Ω
348Ω
R2
∞
∞
∞
Over Recommended Operating Conditions
≤ 1.5ns 10% to 90%
511Ω
511Ω
511Ω
GND to V
R1
∞
∞
∞
See figure
2.5V
1.5V
1.5V
Table 2 - 0004A/5384
475Ω
475Ω
475Ω
Table 2 - 0003/5384
R2
∞
∞
∞
CCIO min
35pF
35pF
35pF
35pF
5pF
5pF
CL
V
V
I
I
OL
OH
OH
OH
= 8 mA
= -4 mA
11
≤ V
≤ V
1
Figure 9. Test Load
*
Device
Output
OUT
OUT
Specifications ispLSI 5384VA
CONDITION
C L includes Test Fixture and Probe Capacitance.
or V
or V
OUT
OUT
≤ V
≤ V
OL (max)
OL
(max)
V
CCIO
MIN.
R 1
R 2
-0.3
3.0
2.0
2.4
–
TYP.
–
–
–
–
–
C L
*
MAX. UNITS
5.25
Table 2-0007/5384VA
3.6
0.8
0.4
–
Point
Test
0213D
V
V
V
V
V