STM32F302VCT6 STMicroelectronics, STM32F302VCT6 Datasheet - Page 85
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STM32F302VCT6
Manufacturer Part Number
STM32F302VCT6
Description
ARM Microcontrollers - MCU 32-Bit ARM Cortex M4 72MHz 256kB MCU FPU
Manufacturer
STMicroelectronics
Datasheet
1.STM32F302RBT6.pdf
(133 pages)
Specifications of STM32F302VCT6
Product Category
ARM Microcontrollers - MCU
Rohs
yes
Core
ARM Cortex M4
Data Bus Width
32 bit
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STM32F302xx/STM32F303xx
6.3.13
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
●
●
These tests are compliant with EIA/JESD 78A IC latch-up standard.
Table 50.
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below V
above V
operation. However, in order to give an indication of the robustness of the microcontroller in
cases when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibility to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into the
I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (higher
than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out
of –5 µA/+0 µA range), or other functional failure (for example reset occurrence or oscillator
frequency deviation).
The test results are given in
Symbol
LU
A supply overvoltage is applied to each power supply pin
A current injection is applied to each input, output and configurable I/O pin
DD
(for standard, 3 V-capable I/O pins) should be avoided during normal product
Static latch-up class
Electrical sensitivities
Parameter
Table 51
Doc ID 023353 Rev 5
T
A
= +105 °C conforming to JESD78A
Conditions
Electrical characteristics
II level A
Class
SS
or
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