550NC840M000DG Silicon Labs, 550NC840M000DG Datasheet - Page 7

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550NC840M000DG

Manufacturer Part Number
550NC840M000DG
Description
VCXO Oscillators SINGLE VCXO 6 PIN 0.5PS RS JTR
Manufacturer
Silicon Labs
Datasheet

Specifications of 550NC840M000DG

Product Category
VCXO Oscillators
Rohs
yes
Package / Case
7 mm x 5 mm
Frequency
840 MHz
Frequency Stability
50 PPM
Output Format
LVDS
Supply Voltage
3.3 V
Termination Style
SMD/SMT
Dimensions
5 mm W x 7 mm L x 1.65 mm H
Minimum Operating Temperature
- 40 C
Maximum Operating Temperature
+ 85 C
Mounting Style
Solder Pad
Product
VCXO
Table 7. CLK± Output Phase Noise (Typical)
Table 8. Environmental Compliance
The Si550 meets the following qualification test requirements.
Table 9. Absolute Maximum Ratings
Mechanical Shock
Mechanical Vibration
Solderability
Gross & Fine Leak
Resistance to Solder Heat
Moisture Sensitivity Level
Contact Pads
Maximum Operating Temperature
Supply Voltage, 1.8 V Option
Supply Voltage, 2.5/3.3 V Option
Input Voltage
Storage Temperature
ESD Sensitivity (HBM, per JESD22-A114)
Soldering Temperature (Pb-free profile)
Soldering Temperature Time @ T
Notes:
Offset Frequency
1. Stresses beyond those listed in Absolute Maximum Ratings may cause permanent damage to the device. Functional
2. The device is compliant with JEDEC J-STD-020C. Refer to Si5xx Packaging FAQ available for download from
operation or specification compliance is not implied at these conditions. Exposure to maximum rating conditions for
extended periods may affect device reliability.
www.silabs.com/VCXO
100 MHz
100 kHz
10 MHz
100 Hz
10 kHz
1 MHz
1 kHz
Parameter
Parameter
for further information, including soldering profiles.
74.25 MHz
90 ppm/V
LVPECL
–132
–142
–148
–150
–114
–87
n/a
PEAK
(Pb-free profile)
2
1
155.52 MHz
45 ppm/V
LVPECL
–128
–133
–144
–147
–111
–86
n/a
Rev. 1.0
2
Symbol
T
T
ESD
V
V
AMAX
PEAK
T
V
t
DD
DD
P
S
I
491.52 MHz
45 ppm/V
LVPECL
–100
–116
–124
–135
–146
–147
–75
MIL-STD-883, Method 2002
MIL-STD-883, Method 2007
MIL-STD-883, Method 1014
MIL-STD-883, Method 2036
MIL-STD-883, Method 203
Conditions/Test Method
J-STD-020, MSL 1
J-STD-020, MSL 1
–0.5 to V
–0.5 to +1.9
–0.5 to +3.8
–55 to +125
Rating
20–40
2500
260
85
DD
622.08 MHz
135 ppm/V
LVPECL
+ 0.3
–109
–121
–134
–146
–147
–65
–90
Si550
seconds
Units
ºC
ºC
ºC
dBc/Hz
V
V
V
V
Units
7

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