M27C512-15F6 STMicroelectronics, M27C512-15F6 Datasheet - Page 11

• Manufacturer Part Number: M27C512-15F6
• Description: IC EPROM 512KBIT 150NS 28CDIP
• Manufacturer: STMicroelectronics

Specifications of M27C512-15F6

• Format - Memory: EPROMs
• Memory Type: UV EPROM
• Memory Size: 512K (64K x 8)
• Speed: 150ns
• Interface: Parallel
• Voltage - Supply: 4.5 V ~ 5.5 V
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 28-CDIP (0.600", 15.24mm) Window
• Capacitance, Input: 6 pF
• Capacitance, Output: 12 pF
• Current, Input, Leakage: ±10 μA (Read)
• Current, Operating: 30 mA (Read)
• Current, Output, Leakage: ±10 μA (Read)
• Current, Supply: 30 mA
• Density: 512K
• Organization: 64K×8
• Package Type: FDIP28W
• Temperature, Operating: 0 to +70 °C
• Temperature, Operating, Maximum: 85 °C
• Temperature, Operating, Minimum: -40 °C
• Time, Access: 100 ns
• Time, Fall: ≤20 ns
• Time, Rise: ≤20 ns
• Voltage, Input, High: 6 V (Read)
• Voltage, Input, High Level: 2 V (Min.)
• Voltage, Input, Low: 0.8 V (Read)
• Voltage, Input, Low Level: -0.3 V (Min.)
• Voltage, Output, High: 4.3 V (Read)
• Voltage, Output, Low: 0.4 V (Read)
• Voltage, Programmable: 11.5 V (Min.)
• Voltage, Supply: 5 V
• Interface Type: Parallel
• Bus Type: Parallel
• In System Programmable: In System/External
• Access Time (max): 150ns
• Reprogramming Technique: UV
• Operating Supply Voltage (typ): 5V
• Operating Supply Voltage (min): 4.5V
• Operating Supply Voltage (max): 5.5V
• Supply Current: 50mA
• Pin Count: 28
• Mounting: Through Hole
• Operating Temp Range: -40C to 85C
• Operating Temperature Classification: Industrial
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: 497-1676-5

Table 7. Read Mode DC Characteristics
Note: 1. V
Table 8. Read Mode AC Characteristics
Note: 1. V
t
t
Symbol
GHQZ
Symbol
EHQZ
t
t
t
V
t
GLQV
AXQX
AVQV
ELQV
I
I
V
V
I
IH
I
CC1
CC2
I
V
I
LO
CC
PP
OH
LI
OL
2. Maximum DC voltage on Output is V
2. Sampled only, not 100% tested.
3. Speed obtained with High Speed AC measurement conditions.
IL
(2)
(2)
(2)
CC
CC
t
must be applied simultaneously with or before V
must be applied simultaneously with or before V
ACC
t
t
Input Leakage Current
Output Leakage Current
Supply Current
Supply Current (Standby) TTL
Supply Current (Standby) CMOS
Program Current
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage TTL
Output High Voltage CMOS
Alt
t
t
t
CE
OE
OH
DF
DF
Address Valid to
Output Valid
Chip Enable Low to
Output Valid
Output Enable Low
to Output Valid
Chip Enable High
to Output Hi-Z
Output Enable
High to Output Hi-Z
Address Transition
to Output Transition
Parameter
Parameter
CC
Test Condition
E = V
E = V
+0.5V.
G = V
G = V
E = V
E = V
IL
IL
, G = V
, G = V
IL
IL
IL
IL
PP
PP
I
and removed simultaneously or after V
IL
IL
and removed simultaneously or after V
OUT
(1)
Test Condition
0V
E = V
E > V
0V
I
OH
I
= 0mA, f = 5MHz
I
OL
V
OH
Min
0
0
0
PP
E = V
V
-45
= –100µA
IL
= 2.1mA
V
CC
OUT
= –1mA
, G = V
IN
= V
(3)
Max
– 0.2V
IH
45
45
25
25
25
CC
V
V
CC
CC
IL
(1)
,
Min
0
0
0
-60
Max
M27C512
60
60
30
25
25
V
CC
Min
–0.3
0
0
0
Min
PP
PP
3.6
– 0.7V
2
-70
.
.
Max
70
70
35
30
30
V
Min
CC
Max
±10
±10
100
0
0
0
0.8
0.4
30
10
1
-80
+ 1
M27C512
Max
80
80
40
30
30
Unit
mA
mA
µA
µA
µA
µA
11/22
V
V
V
V
V
Unit
ns
ns
ns
ns
ns
ns