MT46H8M32LFB5-5:H TR Micron Technology Inc, MT46H8M32LFB5-5:H TR Datasheet - Page 32
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MT46H8M32LFB5-5:H TR
Manufacturer Part Number
MT46H8M32LFB5-5:H TR
Description
IC DDR SDRAM 256MBIT 90VFBGA
Manufacturer
Micron Technology Inc
Datasheet
1.MT46H16M16LFBF-5H.pdf
(96 pages)
Specifications of MT46H8M32LFB5-5:H TR
Format - Memory
RAM
Memory Type
Mobile DDR SDRAM
Memory Size
256M (8Mx32)
Speed
200MHz
Interface
Parallel
Voltage - Supply
1.7 V ~ 1.95 V
Operating Temperature
0°C ~ 70°C
Package / Case
90-VFBGA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Functional Description
PDF: 09005aef834bf85b
256mb_mobile_ddr_sdram_t36n.pdf - Rev. H 11/09 EN
The Mobile LPDDR SDRAM uses a double data rate architecture to achieve high-speed
operation. The double data rate architecture is essentially a 2n-prefetch architecture,
with an interface designed to transfer two data words per clock cycle at the I/O. Single
read or write access for the device consists of a single 2n-bit-wide, one-clock-cycle data
transfer at the internal DRAM core and two corresponding n-bit-wide, one-half-clock-
cycle data transfers at the I/O.
A bidirectional data strobe (DQS) is transmitted externally, along with data, for use in
data capture at the receiver. DQS is a strobe transmitted by the device during READs
and by the memory controller during WRITEs. DQS is edge-aligned with data for READs
and center-aligned with data for WRITEs. The x16 device has two data strobes, one for
the lower byte and one for the upper byte; the x32 device has four data strobes, one per
byte.
The LPDDR device operates from a differential clock (CK and CK#); the crossing of CK
going HIGH and CK# going LOW will be referred to as the positive edge of CK. Com-
mands (address and control signals) are registered at every positive edge of CK. Input
data is registered on both edges of DQS, and output data is referenced to both edges of
DQS, as well as to both edges of CK.
Read and write accesses to the device are burst-oriented; accesses start at a selected
location and continue for a programmed number of locations in a programmed se-
quence. Accesses begin with the registration of an ACTIVE command, followed by a
READ or WRITE command. The address bits registered coincident with the ACTIVE com-
mand are used to select the bank and row to be accessed. The address bits registered
coincident with the READ or WRITE command are used to select the starting column
location for the burst access.
The device provides for programmable READ or WRITE burst lengths of 2, 4, 8, or 16. An
auto precharge function can be enabled to provide a self-timed row precharge that is
initiated at the end of the burst access.
As with standard DDR SDRAM, the pipelined, multibank architecture of LPDDR sup-
ports concurrent operation, thereby providing high effective bandwidth by hiding row
precharge and activation time.
An auto refresh mode is provided, along with a power-saving power-down mode. Deep
power-down mode is offered to achieve maximum power reduction by eliminating the
power of the memory array. Data will not be retained after the device enters deep power-
down mode.
Two self refresh features, temperature-compensated self refresh (TCSR) and partial-ar-
ray self refresh (PASR), offer additional power savings. TCSR is controlled by the auto-
matic on-chip temperature sensor. PASR can be customized using the extended mode
register settings. The two features can be combined to achieve even greater power savings.
The DLL that is typically used on standard DDR devices is not necessary on LPDDR de-
vices. It has been omitted to save power.
32
256Mb: x16, x32 Mobile LPDDR SDRAM
Micron Technology, Inc. reserves the right to change products or specifications without notice.
Functional Description
©2008 Micron Technology, Inc. All rights reserved.