M27C801-100B1 STMicroelectronics, M27C801-100B1 Datasheet - Page 14

IC OTP 8MBIT 100NS 32DIP

M27C801-100B1

Manufacturer Part Number
M27C801-100B1
Description
IC OTP 8MBIT 100NS 32DIP
Manufacturer
STMicroelectronics
Datasheets

Specifications of M27C801-100B1

Format - Memory
EPROMs
Memory Type
OTP EPROM
Memory Size
8M (1M x 8)
Speed
100ns
Interface
Parallel
Voltage - Supply
4.5 V ~ 5.5 V
Operating Temperature
0°C ~ 70°C
Package / Case
32-DIP (0.600", 15.24mm)
Organization
1Mx8
Interface Type
Parallel
In System Programmable
External
Access Time (max)
100ns
Package Type
PDIP
Reprogramming Technique
OTP
Operating Supply Voltage (typ)
5V
Operating Supply Voltage (min)
4.5V
Operating Supply Voltage (max)
5.5V
Supply Current
50mA
Pin Count
32
Mounting
Through Hole
Operating Temp Range
0C to 70C
Operating Temperature Classification
Commercial
Capacitance, Input
6 pF
Capacitance, Output
12 pF
Current, Input, Leakage
±10 μA
Current, Operating
35 mA
Current, Output, Leakage
±10
Current, Supply
35 mA (Max.)
Density
8M
Temperature, Operating
0 to +70 °C
Temperature, Operating, Maximum
70 °C
Temperature, Operating, Minimum
0 °C
Time, Access
100 ns
Time, Fall
≤20 ns
Time, Rise
≤20 ns
Voltage, Input, High
6 V
Voltage, Input, High Level
2 V (Min.)
Voltage, Input, Low
0.8 V
Voltage, Input, Low Level
0.80 V (Max.)
Voltage, Output, High
3.6 V (TTL), 4.3 V (CMOS)
Voltage, Output, Low
0.4 V
Voltage, Supply
5 V
Access Time
45ns
Low Power Consumption
- Active current 35mA at 5 MHz - Standby current 100 μA
Programming Voltage
12.75 V ± 0.25 V
Memory Configuration
1M X 8
Supply Voltage Range
4.5V To 5V
Memory Case Style
DIP
No. Of Pins
32
Rohs Compliant
Yes
Operating Temperature Range
0°C To +70°C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
497-1687-5

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DC and AC characteristics
14/24
Figure 6.
Table 6.
1. T
2. Sampled only, not 100% tested.
Table 7.
1. T
2. V
3. Maximum DC voltage on Output is V
Symbol
V
I
I
V
V
Symbol
I
IH
I
CC1
CC2
I
V
I
CC
LO
PP
A
OH
A
CC
C
LI
OL
IL
C
(3)
= 25 °C, f = 1 MHz.
= 0 to 70 °C or –40 to 85 °C; V
OUT
IN
must be applied simultaneously with or before V
Input leakage current
Output leakage current
Supply current
Supply current (Standby) TTL
Supply current (Standby)
CMOS
Program current
Input low voltage
Input high voltage
Output low voltage
Output high voltage TTL
Output high voltage CMOS
AC testing load circuit
Capacitance
Read mode DC characteristics
Input capacitance
Output capacitance
Parameter
Parameter
C L = 30pF for High Speed
C L = 100pF for Standard
C L includes JIG capacitance
(1) (2)
DEVICE
UNDER
TEST
CC
CC
= 5 V ± 10%.
+0.5V.
Test condition
I
OUT
V
E = V
1.3V
V
OUT
IN
Test condition
0V V
E > V
I
0V V
= 0 mA, f = 5 MHz
PP
(1) (2)
OH
I
I
= 0 V
OL
OH
V
= 0 V
IL
1N914
3.3k
PP
and removed simultaneously or after V
E = V
= –100 µA
, GV
= 2.1 mA
C L
= –1 mA
CC
OUT
IN
= V
– 0.2V
PP
IH
V
CC
V
CC
= V
CC
IL
OUT
,
AI01823B
Min.
V
CC
Min.
–0.3
3.6
2
– 0.7
Max.
12
6
V
Max.
CC
±10
±10
100
0.8
0.4
35
10
PP
1
+ 1
.
M27C801
Unit
pF
pF
Unit
mA
mA
V
V
V
V
V
A
A
A
A

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