SST25VF080B-50-4I-S2AF-T Microchip Technology, SST25VF080B-50-4I-S2AF-T Datasheet - Page 28
![no-image](/images/manufacturer_photos/0/4/439/microchip_technology_sml.jpg)
SST25VF080B-50-4I-S2AF-T
Manufacturer Part Number
SST25VF080B-50-4I-S2AF-T
Description
IC FLASH SER 8MB 50MHZ SPI 8SOIC
Manufacturer
Microchip Technology
Specifications of SST25VF080B-50-4I-S2AF-T
Format - Memory
FLASH
Memory Type
FLASH
Memory Size
8M (1M x 8)
Speed
50MHz
Interface
SPI Serial
Voltage - Supply
2.7 V ~ 3.6 V
Operating Temperature
-40°C ~ 85°C
Package / Case
8-SOIC (5.3mm Width), 8-SOP, 8-SOEIAJ
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
SST25VF080B-50-4I-S2AF-T
Manufacturer:
SST
Quantity:
12 000
A Microchip Technology Company
©2011 Silicon Storage Technology, Inc.
Figure 25:Power-up Timing Diagram
Figure 26:AC Input/Output Reference Waveforms
AC test inputs are driven at V
ment reference points for inputs and outputs are V
times (10%
V
V
DD
DD
V
V
V
IHT
Max
Min
ILT
DD
↔
90%) are <5 ns.
INPUT
Commands may not be accepted or properly
Chip selection is not allowed.
interpreted by the device.
IHT
(0.9V
V
V
HT
LT
28
DD
) for a logic “1” and V
REFERENCE POINTS
T
T
PU-READ
PU-WRITE
HT
(0.6V
8 Mbit SPI Serial Flash
DD
Device fully accessible
) and V
ILT
V
V
(0.1V
HT
LT
LT
DD
(0.4V
) for a logic “0”. Measure-
Note: V
SST25VF080B
DD
OUTPUT
V
V
V
). Input rise and fall
LT
IHT
ILT
HT
- V
- V
- V
- V
S71296-05-000
1296 PwrUp.0
LOW
HIGH
1296 IORef.0
INPUT
INPUT
Test
Test
Data Sheet
LOW Test
HIGH Test
Time
02/11