AT29LV1024-20JC Atmel, AT29LV1024-20JC Datasheet - Page 3

• Manufacturer Part Number: AT29LV1024-20JC
• Description: IC FLASH 1MBIT 200NS 44PLCC
• Manufacturer: Atmel

Specifications of AT29LV1024-20JC

• Format - Memory: FLASH
• Memory Type: FLASH
• Memory Size: 1M (64K x 16)
• Speed: 200ns
• Interface: Parallel
• Voltage - Supply: 3 V ~ 3.6 V
• Operating Temperature: 0°C ~ 70°C
• Package / Case: 44-PLCC
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Other names: AT29LV102420JC

tion of WE (or CE). A0 to A6 specify the word address
within the sector. The words may be loaded in any order;
sequential loading is not required. Once a programming
operation has been initiated, and for the duration of t
read operation will effectively be a polling operation.
HARDWARE DATA PROTECTION: Hardware features
protect against inadvertent programs to the AT29LV1024 in
the following ways: (a) V
(typical), the program function is inhibited; (b) V
delay—once V
device will automatically time out 10 ms (typical) before
programming; (c) Program inhibit—holding any one of OE
low, CE high or WE high inhibits program cycles; and
(d) Noise filter—pulses of less than 15 ns (typical) on the
WE or CE inputs will not initiate a program cycle.
INPUT LEVELS: While operating with a 3.3V ± 10% power
supply, the address inputs and control inputs (OE, CE and
WE) may be driven from 0 to 5.5V without adversely affect-
ing the operation of the device. The I/O lines can be driven
from 0 to 3.6V.
PRODUCT IDENTIFICATION: The product identification
mode identifies the device and manufacturer as Atmel. It
may be accessed by hardware or software operation. The
hardware operation mode can be used by an external pro-
grammer to identify the correct programming algorithm for
the Atmel product. In addition, users may wish to use the
software product identification mode to identify the part (i.e.
using the device code), and have the system software use
the appropriate sector size for program operations. In this
Absolute Maximum Ratings*
Temperature Under Bias................................ -55°C to +125°C
Storage Temperature ..................................... -65°C to +150°C
All Input Voltages (including NC Pins)
with Respect to Ground ...................................-0.6V to +6.25V
All Output Voltages
with Respect to Ground .............................-0.6V to V
Voltage on A9 (including NC Pins)
with Respect to Ground ...................................-0.6V to +13.5V
CC
has reached the V
CC
sense—if V
CC
CC
sense level, the
is below 1.8V
CC
CC
power on
+ 0.6V
WC
, a
manner, the user can have a common board design for var-
ious Flash densities and, with each density’s sector size in
a memory map, have the system software apply the appro-
priate sector size.
For details, see Operating Modes (for hardware operation)
or Software Product Identification. The manufacturer and
device code is the same for both modes.
DATA POLLING: The AT29LV1024 features DATA poll-
ing to indicate the end of a program cycle. During a pro-
gram cycle an attempted read of the last word loaded will
result in the complement of the loaded data on I/O7 and
I/O15. Once the program cycle has been completed, true
data is valid on all outputs and the next cycle may begin.
DATA polling may begin at any time during the program
cycle.
T O G G L E B I T :
AT29LV1024 provides another method for determining the
end of a program or erase cycle. During a program or erase
operation, successive attempts to read data from the
device will result in I/O6 and I/O14 toggling between one
and zero. Once the program cycle has completed, I/O6 and
I/O14 will stop toggling and valid data will be read. Examin-
ing the toggle bit may begin at any time during a program
cycle.
OPTIONAL CHIP ERASE MODE: The entire device can
be erased by using a 6-byte software code. Please see
Software Chip Erase application note for details.
*NOTICE:
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability
I n a d d i t i o n t o D A T A p o l l i n g t h e
AT29LV1024
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