TC58DVM82A1FT Toshiba, TC58DVM82A1FT Datasheet - Page 21

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TC58DVM82A1FT

Manufacturer Part Number
TC58DVM82A1FT
Description
IC FLASH 256MBIT 50NS 48TSOP
Manufacturer
Toshiba
Datasheet

Specifications of TC58DVM82A1FT

Format - Memory
FLASH
Memory Type
FLASH - Nand
Memory Size
256M (32M x 8)
Speed
50ns
Interface
Serial
Voltage - Supply
2.7 V ~ 3.6 V
Operating Temperature
0°C ~ 70°C
Package / Case
48-TSOP
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant

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Status Read
RY
RY
~I/O8
CLE
CLE
ALE
I/O1
ALE
Status Read function is used to monitor the Ready/Busy status of the device, determine the result (pass/fail) of a
Program or Erase operation, and determine whether the device is in Protect mode. The device status is output
via the I/O port on the RE clock after a 70H command input. The resulting information is outlined in Table 5.
Table 5. Status output table
I/O1
I/O2
I/O3
I/O4
I/O5
I/O6
I/O7
I/O8
I/O9 to I/O16
/
/
CE
diagram, the Status Read function can be used to determine the status of each individual device.
WE
WE
CE
RE
BY
BY
RE
I/O
The device automatically implements the execution and verification of the Program and Erase operations. The
An application example with multiple devices is shown in Figure 6.
System Design Note: If the
N
1
Device
CE
1
70H
1
Write Protect
Ready/Busy
Pass/Fail
Not Used
Not Used
Not Used
Not Used
Not Used
Not Used
STATUS
RY
Device
CE
Figure 6. Status Read timing application example
Pass: 0
0
0
0
0
0
Ready: 1
Protect: 0
0
2
/
2
BY
Status on
Device 1
pin signals from multiple devices are wired together as shown in the
TC58DVM82A1FT00/ TC58DVM82F1FT00
TC58DAM82A1FT00/ TC58DAM82F1FT00
70H
OUTPUT
Device
CE
Busy
3
3
Fail: 1
Busy: 0
Not Protected: 1
Status on
Device N
valid when the device is in the Ready
state.
The Pass/Fail status on I/O1 is only
Device
CE
N
2003_01_29 21/34
N
CE
Device
N
N
1
1

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