MAX17120ETJ+ Maxim Integrated Products, MAX17120ETJ+ Datasheet - Page 4

• Manufacturer Part Number: MAX17120ETJ+
• Description: IC DRVR SCAN TFT LDC 32-TQFN
• Manufacturer: Maxim Integrated Products

Specifications of MAX17120ETJ+

• Applications: LCD TV/Monitor
• Mounting Type: Surface Mount
• Package / Case: 32-TQFN Exposed Pad
• Maximum Operating Temperature: + 85 C
• Attached Touch Screen: No
• Minimum Operating Temperature: - 40 C
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Current - Supply: -
• Voltage - Supply: -
• Operating Temperature: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

V. Quality Assurance Information
VI. Reliability Evaluation
Maxim Integrated Products. All rights reserved.
A. Quality Assurance Contacts:
B. Outgoing Inspection Level:
C. Observed Outgoing Defect Rate:
D. Sampling Plan:
A. Accelerated Life Test
1000 hour life test monitors on its processes. This data is published in the Product Reliability Report found at http://www.maxim-
ic.com/.
B. Moisture Resistance Tests
C. E.S.D. and Latch-Up Testing
=
MTTF
The following failure rate represents data collected from Maxim’s reliability monitor program. Maxim performs quarterly
The results of the 135°C biased (static) life test are pending. Using these results, the Failure Rate ( ) is calculated as follows:
The industry standard 85°C/85%RH or HAST testing is monitored per device process once a quarter.
The PF59 die type has been found to have all pins able to withstand a HBM transient pulse of:
Latch-Up testing has shown that this device withstands a current of +/-100 mA, 1.5x VCCMax Overvoltage per JESD78.
Current monitor data for the S4 Process results in a FIT Rate of 0.28 @ 25C and 4.85 @ 55C (0.8 eV, 60% UCL)
1
= 22.9 x 10
= 22.9 F.I.T. (60% confidence level @ 25°C)
=
-9
(where 4340 = Temperature Acceleration factor assuming an activation energy of 0.8eV)
192 x 4340 x 48 x 2
1.83
HBM ESD: +/-2500V per JEDEC JESD22-A114
CDM ESD: +/-750V per JESD22-C101
MM ESD:
(Chi square value for MTTF upper limit)
+/-200V per JEDEC JESD22-A115
Ken Wendel (Director, Reliability Engineering)
Bryan Preeshl (Managing Director of QA)
0.1% for all electrical parameters guaranteed by the Datasheet.
0.1% For all Visual Defects.
< 50 ppm
Mil-Std-105D
MAX17120ETJ+
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