6N137(F) Toshiba, 6N137(F) Datasheet - Page 2

PHOTOCOUPLER HS TRANS-OUT 8DIP

6N137(F)

Manufacturer Part Number
6N137(F)
Description
PHOTOCOUPLER HS TRANS-OUT 8DIP
Manufacturer
Toshiba
Datasheet

Specifications of 6N137(F)

Voltage - Isolation
2500Vrms
Number Of Channels
1, Unidirectional
Current - Output / Channel
50mA
Data Rate
10MBd
Propagation Delay High - Low @ If
60ns @ 7.5mA
Current - Dc Forward (if)
20mA
Input Type
DC
Output Type
Open Collector
Mounting Type
Through Hole
Package / Case
8-DIP (0.300", 7.62mm)
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
6N137TF
Absolute Maximum Ratings
Recommended Operating Conditions
Precaution
Operating temperature range
Storage temperature range
Lead solder temperature (10 s)
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
(Note 1) 50% duty cycle, 1ms pulse width.
(Note 2) Soldering portion of lead: Up to 2mm from the body of the device.
Input current, low level each channel
Input current, high level each channel
High level enable voltage
Low level enable voltage (output high)
Supply voltage, output*
Fan out (TTL load)
Operating temperature
Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the
linear amplifier. Failure to provide the bypassing may impair the switching property. The total lead length
between capacitor and coupler should not exceed 1cm.
Please be careful of the followings.
A ceramic capacitor(0.1μF)should be connected from pin 8 to pin 5 to stabilize the operation of the high gain
Forward current
Pulse forward current
Reverse voltage
Output current
Output voltage
Supply voltage (1 minute maximum)
Enable input voltage
(not to exceed V
Output collector power dissipation
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
device. Additionally, each item is an independent guideline respectively. In developing designs using this
product, please confirm specified characteristics shown in this document.
*This item denotes operating ranges, not meaning of recommended operating conditions.
Characteristic
Characteristic
CC
by more than 500mV)
Symbol
V
V
V
I
I
Ta
FH
FL
N
EH
CC
EL
(Note 1)
(Note 2)
Min.
2.0
4.5
0
7
0
0
Symbol
V
V
T
T
T
I
V
P
V
2
I
I
FP
opr
CC
EH
stg
sol
O
F
R
O
O
Max.
V
250
0.8
5.5
20
70
CC
8
Unit
mA
−55~125
μA
°C
V
V
V
Rating
0~70
260
5.5
20
40
50
85
5
7
7
Unit
mW
mA
mA
mA
°C
°C
°C
V
V
V
V
2007-10-01
6N137

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