TLP251(TP1) Toshiba, TLP251(TP1) Datasheet - Page 61

• Manufacturer Part Number: TLP251(TP1)
• Description: PHOTOCOUPLER HS TRANS OUT 8-SMD
• Manufacturer: Toshiba

Specifications of TLP251(TP1)

• Voltage - Isolation: 2500Vrms
• Number Of Channels: 1, Unidirectional
• Current - Output / Channel: 200mA
• Propagation Delay High - Low @ If: 250ns @ 8mA
• Current - Dc Forward (if): 20mA
• Input Type: DC
• Output Type: Push-Pull, Totem-Pole
• Mounting Type: Surface Mount
• Package / Case: 8-SMD (300 mil)
• Number Of Elements: 1
• Forward Voltage: 1.8V
• Forward Current: 20mA
• Isolation Voltage: 2500Vrms
• Package Type: PDIP
• Operating Temp Range: -20C to 85C
• Propagation Delay Time: 1000ns
• Pin Count: 8
• Mounting: Through Hole
• Reverse Breakdown Voltage: 5V
• Operating Temperature Classification: Commercial
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Other names: TLP251TP1; TLP251TR

The above operating life data are estimates extrapolated from long-term light output degradation over a single wafer lot and are
shown as reference only. Operating conditions exceeding the maximum ratings are not guaranteed.
2
2
10000000
1000000
100000
140
120
100
140
120
100
10000
GaA As (SH) LED Projected Operating Life Data
GaA As (SH) LED Projected Light Output Degradation Data
80
60
40
20
80
60
40
20
1000
0
0
100
1
1
227
2.0
I
I
I
I
I
Failure criteria light output degradation Δ P O < –50%
150
F
F
F
F
F
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
10
100
Test conditions: I
Test conditions: I
85
3.0
60
100
100
Test time (h)
Test time (h)
25
F
F
= 50 mA, Ta = 40°C
= 10 mA, Ta = 40°C
0
1000
1000
4.0
I
I
I
I
I
F
F
F
F
F
–30
Ambient Temperature (°C)
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
X-3σ
Projected F50%
operating life
Projected F0.1%
operating life
10000
10000
–50
X-3σ
1 / K (x10
X
X
–73
100000
100000
5.0
-3
)
61
10000000
1000000
100000
140
120
100
10000
80
60
40
20
1000
0
100
1
227
2.0
Failure criteria light output degradation Δ P O < –30%
I
I
I
I
I
150
F
F
F
F
F
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
100
Test conditions: I
85
3.0
60
100
Test time (h)
25
F
= 20 mA, Ta = 40°C
1000
0
4.0
I
I
I
I
I
–30
F
F
F
F
F
Ambient Temperature (°C)
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Projected F0.1%
operating life
Projected F50%
operating life
10000
X-3σ
–50
1 / K (x10
X
–73
100000
5.0
-3
)