TLP3042SCFT Toshiba, TLP3042SCFT Datasheet - Page 60

• Manufacturer Part Number: TLP3042SCFT
• Description: PHOTOCOUPLER ZC TRIAC OUT 6-DIP
• Manufacturer: Toshiba

Specifications of TLP3042SCFT

• Voltage - Isolation: 5000Vrms
• Number Of Channels: 1
• Voltage - Off State: 400V
• Output Type: AC, Triac, Zero Cross
• Current - Gate Trigger (igt) (max): 10mA
• Current - Hold (ih): 600µA
• Current - Dc Forward (if): 20mA
• Current - Output / Channel: 100mA
• Mounting Type: Through Hole
• Package / Case: 6-DIP
• Output Device: PhotoTriac
• Isolation Voltage: 5000 V
• Peak Output Voltage (vdrm): 400 V
• Maximum Input Voltage: 120 VAC
• Maximum Output Voltage: 400 V
• Minimum Trigger Current: 5 mA
• Configuration: 1 Channel
• Maximum Continuous Output Current: 100 mA
• Maximum Input Current: 25 mA
• Maximum Operating Temperature: + 100 C
• Maximum Power Dissipation: 330 mW
• Maximum Reverse Diode Voltage: 5 V
• Minimum Operating Temperature: - 40 C
• Mounting Style: Through Hole
• Zero-crossing Circuit: Yes
• Number Of Elements: 1
• Forward Voltage: 1.3V
• Repetitive Peak Off-state Volt: 400V
• Operating Temp Range: -25C to 85C
• Output Current: 100mA
• Package Type: PDIP
• Reverse Breakdown Voltage: 5V
• Mounting: Through Hole
• Pin Count: 5
• Trigger Current: 5mA
• Zero Crossing Circuit: Yes
• Operating Temperature Classification: Commercial
• Forward Current: 50mA
• Power Dissipation: 330mW
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: TLP3042(S,C,F); TLP3042(S,C,F,T); TLP3042SF

9
The above operating life data are estimates extrapolated from long-term light output degradation over a single wafer lot and are shown as
reference only. Operating conditions exceeding the maximum ratings are not guaranteed.
10000000
1
1
1000000
100000
10000
140
120
100
140
120
100
GaAs LED Projected Light Output Degradation Data
GaAs LED Projected Operating Life Data
1000
Device Degradation
80
60
40
20
80
60
40
20
100
0
0
1
1
227
2.0
I
I
I
I
I
150
F
F
F
F
F
Failure criteria light output degradation Δ P O < –50%
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
10
100
Test conditions: I
Test conditions: I
85
3.0
60
100
100
Test time (h)
Test time (h)
25
F
F
= 50 mA, Ta = 40°C
= 10 mA, Ta = 40°C
0
1000
1000
I
F
4.0
= 10 mA
I
I
I
I
–30
F
F
F
F
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Ambient Temperature (°C)
Projected F50%
operating life
Projected F0.1%
operating life
10000
10000
–50
X-3σ
X-3σ
1 / K (x10
X
X
–73
5.0
100000
100000
-3
)
60
10000000
1000000
100000
10000
140
120
100
1000
80
60
40
20
100
0
1
227
2.0
I
I
I
I
I
150
F
F
F
F
F
Failure criteria light output degradation Δ P O < –30%
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
100
Test conditions: I
85
3.0
60
100
Test time (h)
25
F
= 20 mA, Ta = 40°C
0
1000
4.0
I
I
I
I
I
F
F
F
F
F
–30
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Ambient Temperature (°C)
Projected F50%
operating life
Projected F0.1%
operating life
10000
–50
X-3σ
1 / K (x10
X
–73
5.0
100000
-3
)