MT16VDDF12864HG-40BF2 Micron Technology Inc, MT16VDDF12864HG-40BF2 Datasheet - Page 15

MODULE DDR SDRAM 1GB 200-SODIMM

MT16VDDF12864HG-40BF2

Manufacturer Part Number
MT16VDDF12864HG-40BF2
Description
MODULE DDR SDRAM 1GB 200-SODIMM
Manufacturer
Micron Technology Inc

Specifications of MT16VDDF12864HG-40BF2

Memory Type
DDR SDRAM
Memory Size
1GB
Speed
400MT/s
Package / Case
200-SODIMM
Main Category
DRAM Module
Sub-category
DDR SDRAM
Module Type
200SODIMM
Device Core Size
64b
Organization
128Mx64
Total Density
1GByte
Chip Density
512Mb
Maximum Clock Rate
400MHz
Operating Supply Voltage (typ)
2.6V
Operating Current
1.6A
Number Of Elements
16
Operating Supply Voltage (max)
2.7V
Operating Supply Voltage (min)
2.5V
Operating Temp Range
0C to 70C
Operating Temperature Classification
Commercial
Pin Count
200
Mounting
Socket
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Table 13: I
Notes: 1–5, 8, 10, 12, 47; DDR SDRAM devices only; notes appear on pages 18–20; 0°C
pdf: 09005aef80b57837, source: 09005aef80b577fa
DDAF16C64_128x64HG.fm - Rev. D 9/04 EN
PARAMETER/CONDITION
OPERATING CURRENT: One device bank; Active-Precharge;
(MIN);
Address and control inputs changing once every two clock cycles
OPERATING CURRENT: One device bank; Active-Read-Precharge; Burst = 4;
t
changing once per clock cycle
PRECHARGE POWER-DOWN STANDBY CURRENT: All device banks idle;
Power-down mode;
IDLE STANDBY CURRENT: CS# = HIGH; All device banks are idle;
(MIN);
cycle. V
ACTIVE POWER-DOWN STANDBY CURRENT: One device bank active;
Power-down mode;
ACTIVE STANDBY CURRENT: CS# = HIGH; CKE = HIGH;
active
twice per clock cycle; Address and other control inputs changing once per
clock cycle
OPERATING CURRENT: Burst = 2;
active; Address and control inputs changing once per clock cycle;
(MIN);
OPERATING CURRENT: Burst = 2; Writes; Continuous burst; One device
bank
t
AUTO REFRESH BURST CURRENT:
SELF REFRESH CURRENT: CKE
OPERATING CURRENT: Four device bank interleaving READs
with auto precharge,
and control inputs change only during Active READ, or WRITE commands
NOTE:
RC =
CK (MIN); DQ, DM, and DQS inputs changing twice per clock cycle
a: Value calculated as one module rank in this operating condition, and all other module ranks in I
b: Value calculated reflects all module ranks in this operating condition.
;
active; Address and control inputs changing once per clock cycle;
t
RC (MIN);
I
t
CKE = HIGH; Address and other control inputs changing once per clock
t
OUT
CK =
IN
RC =
= V
= 0mA
t
t
CK (MIN); DQ, DM and DQS inputs changing once per clock cycle;
REF
RAS (MAX);
DD
for DQ, DQS, and DM
t
CK =
Specifications and Conditions – 1GB
t
t
t
CK =
CK =
RC = minimum
t
CK (MIN); I
t
CK =
t
t
CK (MIN); CKE = LOW
CK (MIN);
0.2V
t
CK (MIN); DQ, DM and DQS inputs changing
Reads; Continuous burst; One device bank
OUT
t
RC allowed;
CKE = (LOW)
= 0mA; Address and control inputs
t
CK =
t
t
t
One device bank
REFC =
REFC = 7.8125µs
CK (MIN); Address
15
t
RC =
(Burst = 4)
t
RFC (MIN)
t
CK =
t
CK =
t
RC
512MB, 1GB (x64, DR) PC3200
Micron Technology, Inc., reserves the right to change products or specifications without notice.
t
t
CK
CK =
t
CK
I
I
I
I
I
I
I
SYM
DD4W
DD3N
DD5A
I
I
DD4R
I
I
I
DD2P
DD2F
DD3P
DD0
DD1
DD5
DD6
DD7
200-PIN DDR SODIMM
T
A
+70°C; V
MAX
1,280
1,520
1,560
1,600
5,520
3,640
-40B
880
720
960
176
80
80
DD
DD
, V
2p (CKE LOW) mode.
UNITS
DD
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
©2004 Micron Technology, Inc.
Q = +2.6V ±0.1V
21, 28, 43
21, 28, 43
NOTES
20, 41
20, 41
20, 41
20, 43
24, 43
20, 42
44
20
9

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