KIT33984PNAEVB Freescale Semiconductor, KIT33984PNAEVB Datasheet - Page 6

• Manufacturer Part Number: KIT33984PNAEVB
• Description: KIT PRELIM EVALUATION MC3398PNA
• Manufacturer: Freescale Semiconductor
• Type: Other Power Managementr

Specifications of KIT33984PNAEVB

• Main Purpose: Power Management, High Side Driver (Internal FET)
• Embedded: No
• Utilized Ic / Part: MC33984
• Primary Attributes: Output current monitoring, 2 SPI-selectable current ratios
• Secondary Attributes: SPI control of over-current limit, open load detection, output ON/OFF, slew rates
• Input Voltage: 6 V to 27 V
• Interface Type: SPI
• Product: Power Management Modules
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• For Use With/related Products: MC33984

Table 3. Maximum Ratings
6
33984
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
ELECTRICAL RATINGS
Output Voltage
Notes
Operating Voltage Range
VDD Supply Voltage
Input/Output Voltage
SO Output Voltage
WAKE Input Clamp Current
CSNS Input Clamp Current
Output Current
Output Clamp Energy
ESD Voltage
1.
2.
3.
4.
All voltages are with respect to ground unless otherwise noted.
Steady-state
Positive
Negative
33984B
33984C
Human Body Model (HBM)
Charge Device Model (CDM)
Corner Pins (1, 12, 15, 16)
All Other Pins (2, 11, 13, 14)
Exceeding this voltage limit may cause permanent damage to the device.
Continuous high side output current rating so long as maximum junction temperature is not exceeded. Calculation of maximum output
current using package thermal resistance is required.
Active clamp energy using single-pulse method (L = 16 mH, R
ESD1 testing is performed in accordance with the Human Body Model (HBM) (C
performed in accordance with the Charge Device Model (CDM), Robotic (Czap = 4.0 pF).
(4)
(2)
(1)
(1)
(3)
Rating
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
L
= 0,V
CSNS, SI, SCLK,
V
PWR
IN[0:1]
I
I
Symbol
CL(WAKE)
CL(CSNS)
E
CS, FS
I
V
V
V
HS[0:1]
= 12 V, T
CL[0:1]
V
V
V
,
ESD1
ESD3
PWR
DD
RST
SO
HS
ZAP
, FSI
J
= 100 pF, R
= 150°C).
Analog Integrated Circuit Device Data
- 0.3 to V
ZAP
- 0.3 to 7.0
-0.3 to 5.5
-16 to 41
= 1500 Ω); ESD3 testing is
± 2000
Value
±750
±500
0.75
-15
2.5
0.5
10
41
30
DD
Freescale Semiconductor
+ 0.3
Unit
mA
mA
V
V
V
V
V
A
V
J