KIT33298DWEVB Freescale Semiconductor, KIT33298DWEVB Datasheet - Page 11

• Manufacturer Part Number: KIT33298DWEVB
• Description: KIT EVAL FOR MC33298 SMART SW
• Manufacturer: Freescale Semiconductor

Specifications of KIT33298DWEVB

• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

Analog Integrated Circuit Device Data
Freescale Semiconductor
SO (Low-to-High) is for an output with internal conditions such that
the low-to-high transition of CS causes the SO output to switch from
high to low.
1. SO (high-to-low) waveform is for SO output with internal conditions such
2. SO (low-to-high) waveform is for SO output with internal conditions such
SCLK
SO
(Low-to-High)
SO
(High-to-Low)
CS
SO
SO
(High-to-Low)
(Low-to-High)
that SO output is low except when an output is disabled as a result of de-
tecting a circuit fault with CS in a High Logic state, e.g. open load.
that SO output is high except when an output is disabled as a result of de-
tecting a circuit fault with CS in a High Logic state, e.g. shortened load.
Figure 8. Enable and Disable Time Waveforms
0.2V DD
0.7V
Figure 7. Valid Data Delay Time and
0.2V
0.7V
DD
t
t
t
DLY(LH)
VALID
DLY(HL)
t
R(SI)
DD
DD
Valid Time Waveforms
< 10 ns
t
R (SI)
t SO(EN)
t SO(EN)
10%
90%
< 10 ns
90%
10%
t
t
R (SO)
F (SO)
50%
tF(SI)
0.7V
0.2 V
90%
< 10 ns
0.7 V DD
DD
DD
t SO(DIS)
t SO(DIS)
t
F (SI)
V
V
10%
< 10ns
Tri-State
Tri-State
0.2V
DD
5.0V
t
5.0 V
0
V0H
SO(dis)
0
V
V
V
V
0H
0L
0H
0L
C
C
L
L
CS
represents the total capacitance of the test fixture and probe.
CS
represents the total capacitance of the test fixture and probe.
Figure 10. Output Fault Unlatch Disable
Figure 9. Switching Time Test Circuit
V
V
Delay Test Circuit
DD
33298
DD
Under
33298
Test
ELECTRICAL PERFORMANCE CURVES
Under
Test
= 5.0V
= 5.0V
ELECTRICAL CHARACTERISTICS
V
V
PWR
PWR
= 14V
= 11V
C
R
C
L
(Output ΟΝ)
L
I L = 2.0A
L
= 26Ω
= 20 pF
Output
Output
33298
11