MFRC52301HN1,157 NXP Semiconductors, MFRC52301HN1,157 Datasheet - Page 80

• Manufacturer Part Number: MFRC52301HN1,157
• Description: IC READER 13.56MHZ 32-HVQFN
• Manufacturer: NXP Semiconductors

Specifications of MFRC52301HN1,157

• Frequency: 13.56MHz
• Package / Case: 32-VQFN Exposed Pad, 32-HVQFN, 32-SQFN, 32-DHVQFN
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Features: -
• Rf Type: -
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: 935282956157

NXP Semiconductors
MFRC523_34
Product data sheet
PUBLIC
16.1.3.1 Example: Output test signals TestDAC1 and TestDAC2
16.1.3 Test signals on pins AUX1 or AUX2
Table 156. Test bus signals: TestBusSel[4:0] = 0Dh
The MFRC523 allows the user to select internal signals for measurement on pins AUX1 or
AUX2. These measurements can be helpful during the design-in phase to optimize the
design or used for test purposes.
Table 157
AnalogSelAux1[3:0] or AnalogSelAux2[3:0] in the AnalogTestReg register.
Remark: The DAC has a current output, therefore it is recommended that a 1 kΩ
pull-down resistor is connected to pin AUX1 or pin AUX2.
Table 157. Test signal descriptions
The AnalogTestReg register is set to 11h. The output on pin AUX1 has the test signal
TestDAC1 and the output on pin AUX2 has the test signal TestDAC2. The signal values of
TestDAC1 and TestDAC2 are controlled by the TestDAC1Reg and TestDAC2Reg
registers.
Figure 28
TestDAC1Reg register is programmed with a slope defined by values 00h to 3Fh and the
TestDAC2Reg register is programmed with a rectangular signal defined by values 00h
and 3Fh.
Pins
D6
D5
D4 to D3
D2
D1
AnalogSelAuxn[3:0] Signal on pin AUXn
0000
0001
0010
0011
0100
0101
0110
0111 to 1001
1010
1011
1100
1101
1110
1111
shows test signal TestDAC1 on pin AUX1 and TestDAC2 on pin AUX2 when the
shows the signals that can be switched to pin AUX1 or AUX2 by setting
Internal test
signal name
clkstable
clk27/8
-
clk27
-
All information provided in this document is subject to legal disclaimers.
Rev. 3.5 — 24 September 2010
3-state
DAC: register TestDAC1 or TestDAC2
DAC: test signal Corr1
reserved
DAC: test signal MinLevel
DAC: test signal ADC_I
DAC: test signal ADC_Q
reserved
HIGH
LOW
TxActive
RxActive
subcarrier detected
TstBusBit
Description
oscillator output signal
oscillator output signal divided by 8
reserved
oscillator output signal
reserved
115235
Contactless reader IC
MFRC523
© NXP B.V. 2010. All rights reserved.
80 of 97