AD5323ARUZ Analog Devices Inc, AD5323ARUZ Datasheet - Page 10

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AD5323ARUZ

Manufacturer Part Number
AD5323ARUZ
Description
IC,D/A CONVERTER,DUAL,12-BIT,CMOS,TSSOP,16PIN
Manufacturer
Analog Devices Inc
Datasheet

Specifications of AD5323ARUZ

Settling Time
8µs
Number Of Bits
12
Data Interface
Serial
Number Of Converters
2
Voltage Supply Source
Single Supply
Power Dissipation (max)
2.5mW
Operating Temperature
-40°C ~ 105°C
Mounting Type
Surface Mount
Package / Case
16-TSSOP
Number Of Channels
2
Resolution
12b
Conversion Rate
125KSPS
Interface Type
SER 3W SPI QSPI UW
Single Supply Voltage (typ)
3.3/5V
Dual Supply Voltage (typ)
Not RequiredV
Architecture
Resistor-String
Power Supply Requirement
Single
Output Type
Voltage
Single Supply Voltage (min)
2.5V
Single Supply Voltage (max)
5.5V
Dual Supply Voltage (min)
Not RequiredV
Dual Supply Voltage (max)
Not RequiredV
Operating Temp Range
-40C to 105C
Operating Temperature Classification
Industrial
Mounting
Surface Mount
Pin Count
16
Package Type
TSSOP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
AD5303/AD5313/AD5323
TERMINOLOGY
Relative Accuracy or Integral Nonlinearity (INL)
For the DAC, relative accuracy or integral nonlinearity is a
measure of the maximum deviation, in LSB, from a straight
line passing through the actual endpoints of the DAC transfer
function. A typical INL error vs. code plot can be seen in
Figure 7, Figure 8, and Figure 9.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified DNL of ±1 LSB maximum ensures monotonic-
ity. This DAC is guaranteed monotonic by design. A typical
DNL error vs. code plot can be seen in Figure 10, Figure 11, and
Figure 12.
Offset Error
This is a measure of the offset error of the DAC and the output
amplifier. It is expressed as a percentage of the full-scale range.
Gain Error
This is a measure of the span error of the DAC. It is the devia-
tion in slope of the actual DAC transfer characteristic from the
ideal expressed as a percentage of the full-scale range.
Offset Error Drift
This is a measure of the change in offset error with changes in
temperature. It is expressed in (ppm of full-scale range)/°C.
Gain Error Drift
This is a measure of the change in gain error with changes in
temperature. It is expressed in (ppm of full-scale range)/°C.
Major-Code Transition Glitch Energy
Major-code transition glitch energy is the energy of the impulse
injected into the analog output when the code in the DAC register
changes state. It is normally specified as the area of the glitch in
nV-s and is measured when the digital code is changed by 1 LSB
at the major carry transition (011 . . . 11 to 100 . . . 00 or 100 . . .
00 to 011 . . . 11).
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital input pins of the
device, but is measured when the DAC is not being written to
( SYNC held high). It is specified in nV-s and is measured with a
full-scale change on the digital input pins, that is, from all 0s to
all 1s and vice versa.
Analog Crosstalk
This is the glitch impulse transferred to the output of one DAC
due to a change in the output of the other DAC. It is measured
by loading one of the input registers with a full-scale code
change (all 0s to all 1s and vice versa) while keeping LDAC
high. Then pulse LDAC low and monitor the output of the
DAC whose digital code was not changed. The area of the
glitch is expressed in nV-s.
Rev. B | Page 10 of 28
DAC-to-DAC Crosstalk
This is the glitch impulse transferred to the output of one DAC
due to a digital code change and subsequent output change of
the other DAC. This includes both digital and analog crosstalk.
It is measured by loading one of the DACs with a full-scale code
change (all 0s to all 1s and vice versa) while keeping LDAC low
and monitoring the output of the other DAC. The area of the
glitch is expressed in nV-s.
DC Crosstalk
This is the dc change in the output level of one DAC in response
to a change in the output of the other DAC. It is measured with
a full-scale output change on one DAC while monitoring the
other DAC. It is expressed in microvolts.
Power Supply Rejection Ratio (PSRR)
This indicates how the output of the DAC is affected by changes
in the supply voltage. PSRR is the ratio of the change in V
a change in V
in decibels. V
Reference Feedthrough
This is the ratio of the amplitude of the signal at the DAC output to
the reference input when the DAC output is not being updated
(that is, LDAC is high). It is expressed in decibels.
Total Harmonic Distortion (THD)
This is the difference between an ideal sine wave and its
attenuated version using the DAC. The sine wave is used as
the reference for the DAC and the THD is a measure of the
harmonics present on the DAC output. It is measured in
decibels.
Multiplying Bandwidth
The amplifiers within the DAC have a finite bandwidth. The
multiplying bandwidth is a measure of this. A sine wave on the
reference (with full-scale code loaded to the DAC) appears on
the output. The multiplying bandwidth is the frequency at
which the output amplitude falls to 3 dB below the input.
Channel-To-Channel Isolation
This is a ratio of the amplitude of the signal at the output of one
DAC to a sine wave on the reference input of the other DAC. It
is measured in decibels.
REF
DD
for full-scale output of the DAC. It is measured
is held at 2 V and V
DD
is varied ±10%.
OUT
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