TB28F008S3-150 Intel, TB28F008S3-150 Datasheet - Page 7

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TB28F008S3-150

Manufacturer Part Number
TB28F008S3-150
Description
Manufacturer
Intel
Datasheet

Specifications of TB28F008S3-150

Density
8Mb
Access Time (max)
150ns
Interface Type
Parallel
Boot Type
Not Required
Address Bus
20b
Operating Supply Voltage (typ)
3/3.3V
Operating Temp Range
-40C to 85C
Package Type
SOP
Program/erase Volt (typ)
2.7 to 3.6V
Sync/async
Asynchronous
Operating Temperature Classification
Industrial
Operating Supply Voltage (min)
2.7V
Operating Supply Voltage (max)
3.6V
Word Size
8b
Number Of Words
1M
Supply Current
18mA
Mounting
Surface Mount
Pin Count
44
Lead Free Status / Rohs Status
Not Compliant
A
DQ
CE#
RP#
OE#
WE#
RY/BY#
V
V
GND
NC
0
PP
CC
PRELIMINARY
–A
Sym
0
–DQ
20
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OUTPUT
OUTPUT READY/BUSY#: Indicates the status of the internal WSM. When low, the WSM is
SUPPLY BLOCK ERASE, PROGRAM, LOCK-BIT CONFIGURATION POWER SUPPLY:
SUPPLY DEVICE POWER SUPPLY: Internal detection automatically configures the device
SUPPLY GROUND: Do not float any ground pins.
INPUT/
INPUT
INPUT
INPUT
INPUT
INPUT
Type
ADDRESS INPUTS: Inputs for addresses during read and write operations.
Addresses are internally latched during a write cycle.
DATA INPUT/OUTPUTS: Inputs data and commands during CUI write cycles;
outputs data during memory array, status register, and identifier code read cycles.
Data pins float to high-impedance when the chip is deselected or outputs are
disabled. Data is internally latched during a write cycle.
CHIP ENABLE: Activates the device’s control logic, input buffers, decoders, and
sense amplifiers. CE#-high deselects the device and reduces power consumption to
standby levels.
RESET/DEEP POWER-DOWN: When driven low, RP# inhibits write operations
which provides data protection during power transitions, puts the device in deep
power-down mode, and resets internal automation. RP#-high enables normal
operation. Exit from deep power-down sets the device to read array mode.
RP# at V
lock-bits when the master lock-bit is set. RP# = V
thereby enabling block erase and program operations to locked memory blocks.
Block erase, program, or lock-bit configuration with V
spurious results and should not be attempted.
OUTPUT ENABLE: Gates the device’s outputs during a read cycle.
WRITE ENABLE: Controls writes to the CUI and array blocks. Addresses and data
are latched on the rising edge of the WE# pulse.
performing an internal operation (block erase, program, or lock-bit). RY/BY#-high
indicates that the WSM is ready for new commands, block erase or program is
suspended, or the device is in deep power-down mode. RY/BY# is always active.
For erasing array blocks, programming data, or configuring lock-bits.
With V
lock-bit configuration with an invalid V
results and should not be attempted.
for optimized read performance. Do not float any power pins.
With V
operations at invalid V
results and should not be attempted. Block erase, program, and lock-bit
configuration operations with V
NO CONNECT: Lead is not internally connected; it may be driven or floated.
PP
CC
HH
V
V
16 Mbit
enables setting of the master lock-bit and enables configuration of block
3 Volt Flash
3 Volt Flash
PPLK
4 Mbit
8 Mbit
LKO
, all write attempts to the flash memory are inhibited. Device
Table 1. Pin Descriptions
, memory contents cannot be altered. Block erase, program, and
CC
A
A
A
0
voltages (see DC Characteristics ) produce spurious
0
0
–A
–A
–A
2.7 V, 3.3 V and 12 V V
2.7 V and 3.3 V V
18
19
20
CC
Name and Function
< 2.7 V are not supported.
PP
(see DC Characteristics ) produce spurious
CC
28F004S3/28F008S3/28F016S3
HH
overrides block lock-bits,
PP
IH
< RP# < V
HH
produce
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