M25PX80 Numonyx, M25PX80 Datasheet

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M25PX80

Manufacturer Part Number
M25PX80
Description
8-mbit, Dual I/o, 4-kbyte Subsector Erase, Serial Flash Memory With 75 Mhz Spi Bus Interface
Manufacturer
Numonyx
Datasheet

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Features
August 2008
SPI bus compatible serial interface
75 MHz (maximum) clock frequency
2.3 V to 3.6 V single supply voltage
Dual input/output instructions resulting in an
equivalent clock frequency of 150 MHz:
– Dual Output Fast Read instruction
– Dual Input Fast Program instruction
8 Mbit Flash memory
– Uniform 4-Kbyte subsectors
– Uniform 64-Kbyte sectors
Additional 64-byte user-lockable, one-time
programmable (OTP) area
Erase capability
– Subsector (4-Kbyte) granularity
– Sector (64-Kbyte) granularity
– Bulk Erase (8 Mbit) in 8 s (typical)
Write protections
– Software write protection applicable to
– Hardware write protection: protected area
Deep Power-down mode: 5 μA (typical)
Electronic signature
– JEDEC standard two-byte signature
– Unique ID code (UID) with16 bytes read-
More than 100 000 write cycles per sector
More than 20 year data retention
Packages
– ECOPACK® (RoHS compliant)
every 64-Kbyte sector (volatile lock bit)
size defined by three non-volatile bits (BP0,
BP1 and BP2)
(7114h)
only, available upon customer request
serial Flash memory with 75 MHz SPI bus interface
8-Mbit, dual I/O, 4-Kbyte subsector erase,
Rev 2
VFQFPN8 (MP)
SO8W (MW)
SO8N (MN)
6 × 5 mm
208 mils
150 mils
M25PX80
www.Numonyx.com
1/60
1

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M25PX80 Summary of contents

Page 1

... More than 100 000 write cycles per sector More than 20 year data retention Packages – ECOPACK® (RoHS compliant) August 2008 8-Mbit, dual I/O, 4-Kbyte subsector erase, Rev 2 M25PX80 VFQFPN8 (MP) 6 × SO8W (MW) 208 mils SO8N (MN) 150 mils 1/60 www ...

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Contents 1 Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ...

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Read Status Register (RDSR 6.4.1 ...

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List of tables Table 1. Signal names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ...

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List of figures Figure 1. Logic diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ...

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... Description The M25PX80 Mbit ( serial Flash memory, with advanced write protection mechanisms, accessed by a high speed SPI-compatible bus. The M25PX80 supports two new, high-performance dual input/output instructions: Dual Output Fast Read (DOFR) instruction used to read data MHz ...

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... There is an exposed central pad on the underside of the VFQFPN package. This is pulled, internally and must not be allowed to be connected to any other voltage or signal line on the PCB See section for package dimensions, and how to identify pin-1. Package mechanical V CC DQ1 C M25PX80 Function M25PX80 DQ1 2 7 HOLD W ...

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Signal descriptions 2.1 Serial Data output (DQ1) This output signal is used to transfer data serially out of the device. Data are shifted out on the falling edge of Serial Clock (C). During the Dual Input Fast Program (DIFP) ...

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If the W/V input is kept in a low voltage range ( input. This input signal is used to freeze the size of the area of memory that is protected against program or erase instructions (as ...

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... Serial Data output (DQ1) line at a time, the other devices are high impedance. Resistors R (represented in ensure that the M25PX80 is not selected if the Bus Master leaves the S line in the high impedance state. As the Bus Master may enter a state where all inputs/outputs are in high ...

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Example pF, that is R*C p Master never leaves the SPI bus in the high impedance state for a time period shorter than 5 μs. Figure 4. SPI modes supported CPOL CPHA ...

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Operating features 4.1 Page programming To program one data byte, two instructions are required: Write Enable (WREN), which is one byte, and a Page Program (PP) sequence, which consists of four bytes plus data. This is followed by the ...

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Active Power, Standby Power and Deep Power-down modes When Chip Select (S) is Low, the device is selected, and in the Active Power mode. When Chip Select (S) is High, the device is deselected, but could remain in the ...

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... The environments where non-volatile memory devices are used can be very noisy. No SPI device can operate correctly in the presence of excessive noise. To help combat this, the M25PX80 features the following data protection mechanisms: Power On Reset and an internal timer (t inadvertent changes while the power supply is outside the operating specification ...

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Write Lock and Lock Down bits cannot be performed. A power- up, is required before changes to these bits can be made. When the Lock Down bit is reset, ‘0’, the Write Lock and Lock Down bits ...

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Table 3. Protected area sizes Status Register contents bit bit 2 bit 1 bit The device is ready to accept a Bulk Erase instruction if, and only if, ...

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Figure 5. Hold condition activation C HOLD (standard use) Hold Condition (non-standard use) Hold Condition AI02029D 17/60 ...

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Memory organization The memory is organized as: 1 048 576 bytes (8 bits each) 256 subsectors (4 Kbytes each) 16 sectors (64 Kbytes each) 4096 pages (256 bytes each) 64 OTP bytes located outside the main memory array Each ...

Page 19

Table 4. Memory organization Sector Subsector Address range 255 FF000h 15 240 F0000h 239 EF000h 14 224 E0000h 223 DF000h 13 208 D0000h 207 CF000h 12 192 C0000h 191 BF000h 11 176 B0000h 175 AF000h 10 160 A0000h 159 9F000h ...

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Instructions All instructions, addresses and data are shifted in and out of the device, most significant bit first. Serial Data input(s) DQ0 (DQ1) is (are) sampled on the first rising edge of Serial Clock (C) after Chip Select (S) ...

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Table 5. Instruction set (page Instruction DOFR Dual Output Fast Read Read OTP (Read 64 bytes of ROTP OTP area) Program OTP (Program 64 POTP bytes of OTP area) PP Page Program DIFP Dual Input Fast Program ...

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... Device identification (2 bytes) A Unique ID code (UID) (17 bytes, of which 16 available upon customer request). The manufacturer identification is assigned by JEDEC, and has the value 20h for Numonyx. The device identification is assigned by the device manufacturer, and indicates the memory type in the first byte (71h), and the memory capacity of the device in the second byte (14h). ...

Page 23

See Section 12: Ordering information on page 58 Any Read Identification (RDID) instruction while an Erase or Program cycle is in progress, is not decoded, and has no effect on the cycle that is in progress. The Read Identification (RDID) ...

Page 24

Table 7. Status Register format b7 SRWD Status Register Write Protect The status and control bits of the Status Register are as follows: 6.4.1 WIP bit The Write In Progress (WIP) bit indicates whether the memory is busy with a ...

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SRWD bit The Status Register Write Disable (SRWD) bit is operated in conjunction with the Write Protect (W/V ) signal. The Status Register Write Disable (SRWD) bit and the Write Protect PP (W/V ) signal allow the device to ...

Page 26

Write Protect (W/V Protect (W/V ) signal allow the device to be put in the hardware protected mode (HPM). PP The Write Status Register (WRSR) instruction is not executed once the hardware protected mode (HPM) is entered. Figure 11. ...

Page 27

When the Status Register Write Disable (SRWD) bit of the Status Register is set to 1, two cases need to be considered, depending on the state of Write Protect (W/V If Write Protect (W/V provided that the Write Enable Latch ...

Page 28

Figure 12. Read Data Bytes (READ) instruction sequence and data-out sequence DQ0 High Impedance DQ1 1. Address bits A23 to A22 are Don’t care. 6.7 Read Data Bytes at higher speed (FAST_READ) The device is first ...

Page 29

Figure 13. Read Data Bytes at higher speed (FAST_READ) instruction sequence and data-out sequence DQ0 DQ1 DQ0 DQ1 1. Address bits A23 to A22 are Don’t care. 6.8 Dual ...

Page 30

When the highest address is reached, the address counter rolls over to 00 0000h, so that the read sequence can be continued indefinitely. Figure 14. Dual Output Fast Read instruction sequence S Mode 3 C Mode 2 DQ0 DQ1 S ...

Page 31

Table 9. Lock Register out Bit Bit name b7-b2 b1 Sector Lock Down b0 Sector Write Lock 1. Values of (b1, b0) after power-up are defined in Figure 15. Read Lock Register (RDLR) instruction sequence and data-out sequence S 0 ...

Page 32

Erase, Program or Write cycle is in progress, is rejected without having any effect on the cycle that is in progress. Figure 16. Read OTP (ROTP) instruction and data-out sequence DQ0 High ...

Page 33

If more than 256 bytes are sent to the device, previously latched data are discarded and the last 256 data bytes are guaranteed to be programmed correctly within the same page. If less than 256 data bytes are sent to ...

Page 34

Dual Input Fast Program (DIFP) The Dual Input Fast Program (DIFP) instruction is very similar to the Page Program (PP) instruction, except that the data are entered on two pins (pin DQ0 and pin DQ1) instead of only one. ...

Page 35

Figure 18. Dual Input Fast Program (DIFP) instruction sequence Instruction DQ0 DQ1 DQ0 DATA DQ1 MSB 1. A23 to A22 ...

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Write In Progress (WIP) bit. The Write In Progress (WIP) bit is 1 during the self-timed Program OTP cycle, and when it is completed. At some unspecified time ...

Page 37

Figure 20. How to permanently lock the 64 OTP bytes Byte Byte Byte 6.14 Write to Lock Register (WRLR) The Write to Lock Register (WRLR) instruction allows bits to be changed in the Lock Registers. Before it ...

Page 38

Table 10. Lock Register in Sector All sectors 1. Values of (b1, b0) after power-up are defined in 6.15 Subsector Erase (SSE) The Subsector Erase (SSE) instruction sets to 1 (FFh) all bits inside the chosen subsector. Before it can ...

Page 39

Sector Erase (SE) The Sector Erase (SE) instruction sets to 1 (FFh) all bits inside the chosen sector. Before it can be accepted, a Write Enable (WREN) instruction must previously have been executed. After the Write Enable (WREN) instruction ...

Page 40

Chip Select (S) must be driven High after the eighth bit of the instruction code has been latched in, otherwise the Bulk Erase instruction is not executed. As soon as Chip Select (S) is driven High, the self-timed Bulk Erase ...

Page 41

Chip Select (S) is driven High, it requires a delay and the Deep Power-down mode is entered. CC2 Any Deep Power-down (DP) instruction, while an Erase, Program or Write cycle is in progress, is rejected without ...

Page 42

Figure 26. Release from Deep Power-down (RDP) instruction sequence S C DQ0 DQ1 42/ Instruction High Impedance Deep Power-down mode t RDP Standby mode AI13745 ...

Page 43

Power-up and power-down At power-up and power-down, the device must not be selected (that is Chip Select (S) must follow the voltage applied (min) at power-up, and then for a further delay ...

Page 44

Figure 27. Power-up timing (max (min) Reset state of the device V WI Table 11. Power-up timing and V Symbol ( (min low VSL CC (1) t Time delay to ...

Page 45

Initial delivery state The device is delivered with the memory array erased: all bits are set to 1 (each byte contains FFh). The Status Register contains 00h (all Status Register bits are 0). 45/60 ...

Page 46

... V Electrostatic discharge voltage (Human Body model) ESD 1. Compliant with JEDEC Std J-STD-020C (for small body, Sn- assembly), the Numonyx ECOPACK® 7191395 specification, and the European directive on Restrictions on Hazardous Substances (RoHS) 2002/95/EU. 2. JEDEC Std JESD22-A114A (C1 = 100 pF 1500 Ω 500 Ω). ...

Page 47

DC and AC parameters This section summarizes the operating and measurement conditions, and the DC and AC characteristics of the device. The parameters in the DC and AC Characteristic tables that follow are derived from tests performed under the ...

Page 48

Table 16. DC characteristics Symbol Parameter I Input leakage current LI I Output leakage current LO I Standby current CC1 I Deep Power-down current CC2 Operating current (READ) I CC3 Operating current (DOFR) Operating current (PP) I CC4 Operating current ...

Page 49

Table 17. AC characteristics Test conditions specified in Symbol Alt. Parameter t S active hold time (relative to C) CHSH t S not active setup time (relative to C) SHCH deselect time SHSL CSH ( ...

Page 50

When using the Page Program (PP) instruction to program consecutive bytes, optimized timings are obtained with one sequence including all the bytes versus several sequences of only a few bytes (1 ≤ n ≤ 256). 9. int(A) corresponds to ...

Page 51

Expressed as a slew-rate. 5. Only applicable as a constraint for a WRSR instruction when SRWD is set to ‘1’. Figure 29. Serial input timing S tCHSL C tDVCH DQ0 DQ1 Figure 30. Write Protect Setup and Hold timing ...

Page 52

Figure 31. Hold timing S C DQ1 DQ0 HOLD Figure 32. Output timing S C tCLQV tCLQX tCLQX DQ1 ADDR. DQ0 LSB IN 52/60 tHLCH tCHHL tCHHH tHLQZ tHHQX tCH tCLQV tCL tQLQH tQHQL tHHCH AI13746 tSHQZ LSB OUT AI13729 ...

Page 53

Figure 33. V timing PPH S C DQ0 BE V PPH V PP tVPPHSL End of BE (identified by WIP polling) ai13726 53/60 ...

Page 54

... JEDEC Standard JESD97. The maximum ratings related to soldering conditions are also marked on the inner box label. ECOPACK is an Numonyx trademark. ECOPACK specifications are available at: www.numonyx.com. Figure 34. VFQFPN8 (MLP8) 8-lead very thin fine pitch quad flat package no lead, 6 × ...

Page 55

Table 19. VFQFPN8 (MLP8) 8-lead very thin fine pitch quad flat package no lead, 6 × 5 mm, package mechanical data Millimeters Symbol Typ Min R1 0.10 0.00 L 0.60 0.50 Θ aaa bbb ddd Figure 35. SO8W 8-lead plastic ...

Page 56

Table 20. SO8W 8-lead plastic small outline, 208 mils body width, package mechanical data Symbol Typ Figure 36. SO8N – 8 lead plastic small outline, 150 mils body width, package outline ...

Page 57

Table 21. SO8N – 8 lead plastic small outline, 150 mils body width, package mechanical data millimeters Symbol Typ Min e 1. 0.40 L1 1.04 Max Typ – – 0.050 0.50 0° 8° 1.27 0.041 inches ...

Page 58

... Secure options are available upon customer request. 2. Grade 3 is available only in devices delivered in SO8N packages. Note: For a list of available options (speed, package, etc.) or for further information on any aspect of this device, please contact your nearest Numonyx Sales Office. 58/60 M25PX80 – ...

Page 59

Revision history Table 23. Document revision history Date Revision 12-Aug-2008 0.1 27-Aug-2008 0.2 Changes Initial release. Corrected bulk erase specifications on the cover page; Deleted sector 16 from the memory map; Changed Vwi from 2 2.1 V ...

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