m34116 STMicroelectronics, m34116 Datasheet - Page 6

• Manufacturer Part Number: m34116
• Description: Pcm Conference Call And Tone Generation Circuit
• Manufacturer: STMicroelectronics

M34116
ELECTRICAL CHARACTERISTICS (continued)
A.C. TESTING, OUTPUT WAVEFORM
6/23
(interface
D0 to D7
Signal
TD/TF
bus)
OS
EC
CS
CD
t
t
t
t
t
t
t
t
t
t
t
t
SL (CS-WR)
HL (CS-WR)
SH (CS-WR)
HH (CS-WR)
HH (CS-RD)
t
t
Symbol
SL (CS-RD)
HL (CS-RD)
SH (CS-RD)
S(BUS-WR)
H(BUS-WR)
S(C/D-WR)
H(C/D-WR)
S(C/D-RD)
H(C/D-RD)
t
t
t
t
PD(BUS)
HZ(BUS)
PD(OS)
PD(EC)
t
t
S
H
A.C. testing inputs are driven at 2.4V for a logic ”1” and 0.45V for a logic ”0”, timing
measurement are made at 2.0V for a logic ”1” and 0.8V for a logic ”0”.
Low level set-up time
to WR falling edge.
Low Level hold time from
WR rising edge.
High level set-up time to
WR falling edge.
High level hold time from
WR rising edge.
Low level set-up time
to RD falling edge.
Low Level hold time from
RD rising edge.
High level set-up time to
RD falling edge.
High level hold time from
RD rising edge.
Set-up time to write strobe
end.
Hold time from write
strobe end.
Set-up time to read strobe
start.
Hold time from read
strobe end.
Propagation time from
rising edge of CK.
Propagation time referred
to CK edges.
Set-up
Hold Time
Input set-up time to write
strobe end.
Input hold time from write
strobe end.
Propagation time from
(active) falling edge of
read strobe.
Propagation time from
(active) rising edge of
read strobe to high
impedance state.
Parameter
Active Case
Active Case
Inactive Case
Inactive Case
Active Case
Active Case
Inactive Case
Inactive Case
C
C
L
L
= 50pF
= 50pF
Test Condition
CL = 200pF
Min.
130
130
20
20
25
20
25
80
40
25
0
0
0
0
0
0
Typ.
Max.
100
120
30
80
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns