SST29EE512-70-4C-EH SST [Silicon Storage Technology, Inc], SST29EE512-70-4C-EH Datasheet - Page 16

• Manufacturer Part Number: SST29EE512-70-4C-EH
• Description: 512 Kbit (64K x8) Page-Write EEPROM
• Manufacturer: SST [Silicon Storage Technology, Inc]

Data Sheet
©2005 Silicon Storage Technology, Inc.
AC test inputs are driven at V
inputs and outputs are V
FIGURE 13: AC I
FIGURE 14: A T
V IHT
V ILT
TO DUT
EST
NPUT
L
INPUT
HT
OAD
/O
(2.0 V) and V
UTPUT
IHT
E
XAMPLE
(2.4V) for a logic “1” and V
R
EFERENCE
LT
V HT
V LT
(0.8 V). Input rise and fall times (10%
C L
W
TO TESTER
AVEFORMS
REFERENCE POINTS
16
ILT
(0.4 V) for a logic “0”. Measurement reference points for
R L LOW
V HT
512 Kbit Page-Write EEPROM
V LT
↔
90%) are <10 ns.
1060 F14.0
OUTPUT
R L HIGH
V DD
Note: V
1060 F13.0
V
V
V
LT
IHT
ILT
HT
- V
SST29EE512
- V
- V
- V
S71060-09-000
LOW
HIGH
INPUT
INPUT
Test
Test
LOW Test
HIGH Test
9/05