IRHNA3Z60 IRF [International Rectifier], IRHNA3Z60 Datasheet

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IRHNA3Z60

Manufacturer Part Number
IRHNA3Z60
Description
RADIATION HARDENED POWER MOSFET SURFACE MOUNT(SMD-2)
Manufacturer
IRF [International Rectifier]
Datasheet
RADIATION HARDENED
POWER MOSFET
SURFACE MOUNT(SMD-2)
International Rectifier’s RADHard HEXFET
ogy provides high performance power MOSFETs for
space applications. This technology has over a de-
cade of proven performance and reliability in satellite
applications. These devices have been character-
ized for both Total Dose and Single Event Effects (SEE).
The combination of low Rds(on) and low gate charge
reduces the power losses in switching applications
such as DC to DC converters and motor control. These
devices retain all of the well established advantages
of MOSFETs such as voltage control, fast switching,
ease of paralleling and temperature stability of elec-
trical parameters.
Absolute Maximum Ratings
Product Summary
Part Number
I D @ V GS = 12V, T C = 100°C Continuous Drain Current
For footnotes refer to the last page
I D @ V GS = 12V, T C = 25°C
www.irf.com
*Current is limited by internal wire diameter
IRHNA7Z60
IRHNA3Z60
IRHNA4Z60
IRHNA8Z60
P D @ T C = 25°C
T STG
dv/dt
V GS
E AS
E AR
I DM
I AR
T J
1000K Rads (Si) 0.009
Radiation Level
100K Rads (Si)
300K Rads (Si)
600K Rads (Si)
Parameter
Continuous Drain Current
Pulsed Drain Current
Max. Power Dissipation
Linear Derating Factor
Gate-to-Source Voltage
Single Pulse Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
Operating Junction
Storage Temperature Range
Package Mounting Surface Temperature
Weight
R
0.009
0.009
0.009
DS(on)
®
75*A
75*A
75*A
75*A
I
technol-
D
RAD-Hard
Features:
n
n
n
n
n
n
n
n
n
n
Single Event Effect (SEE) Hardened
Low R
Low Total Gate Charge
Proton Tolerant
Simple Drive Requirements
Ease of Paralleling
Hermetically Sealed
Surface Mount
Ceramic Package
Light Weight
300 ( for 5 sec.)
HEXFET
DS(on)
3.3 (Typical )
-55 to 150
30V, N-CHANNEL
0.35
300
300
±20
500
75*
2.4
75*
75
30
IRHNA7Z60
®
TECHNOLOGY
SMD-2
Pre-Irradiation
PD - 91708B
Units
W/°C
V/ns
mJ
mJ
o
A
W
V
A
C
g
12/18/01
1

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IRHNA3Z60 Summary of contents

Page 1

... RADIATION HARDENED POWER MOSFET SURFACE MOUNT(SMD-2) Product Summary Part Number Radiation Level IRHNA7Z60 100K Rads (Si) IRHNA3Z60 300K Rads (Si) IRHNA4Z60 600K Rads (Si) IRHNA8Z60 1000K Rads (Si) 0.009 International Rectifier’s RADHard HEXFET ogy provides high performance power MOSFETs for space applications. This technology has over a de- cade of proven performance and reliability in satellite applications ...

Page 2

IRHNA7Z60 Electrical Characteristics Parameter BV DSS Drain-to-Source Breakdown Voltage BV DSS / T J Temperature Coefficient of Breakdown Voltage R DS(on) Static Drain-to-Source On-State Resistance V GS(th) Gate Threshold Voltage g fs Forward Transconductance I DSS Zero Gate Voltage Drain ...

Page 3

... Diode Forward Voltage SD 1. Part number IRHNA7Z60 2. Part numbers IRHNA3Z60, IRHNA4Z60 and IRHNA8Z60 International Rectifier radiation hardened MOSFETs have been characterized in heavy ion environment for Single Event Effects (SEE). Single Event Effects characterization is illustrated in Fig. a and Table 2. Table 2. Single Event Effect Safe Operating Area ...

Page 4

IRHNA7Z60  1000 VGS TOP 15V 12V 10V 9.0V 8.0V 7.0V 6.0V BOTTOM 5.0V 100 5.0V  20µs PULSE WIDTH 0 Drain-to-Source Voltage (V) DS Fig 1. Typical Output Characteristics 1000 ...

Page 5

Pre-Irradiation  15000 1MHz iss rss gd C oss 12000 oss iss 9000 ...

Page 6

IRHNA7Z60 160  L IMITED BY PACKAGE 120 100 T , Case Temperature ( C) C Fig 9. Maximum Drain Current Vs. Case Temperature 0.50 0.1 0.20 0.10 0.05 0.02  ...

Page 7

Pre-Irradiation 20V Fig 12a. Unclamped Inductive Test Circuit Fig 12b. Unclamped Inductive Waveforms ...

Page 8

IRHNA7Z60 Foot Notes: Repetitive Rating; Pulse width limited by maximum junction temperature 25V, starting 25°C, L=0.17mH Peak 75A =12V I SD 75A, di/dt 94A 30V, T ...

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