C8051F34B-GM Silicon Laboratories Inc, C8051F34B-GM Datasheet - Page 24
![IC 8051 MCU 32K FLASH MEM 32-QFN](/photos/12/27/122778/c8051f34b-gm_sml.jpg)
C8051F34B-GM
Manufacturer Part Number
C8051F34B-GM
Description
IC 8051 MCU 32K FLASH MEM 32-QFN
Manufacturer
Silicon Laboratories Inc
Series
C8051F34xr
Datasheet
1.C8051F349-GQ.pdf
(276 pages)
Specifications of C8051F34B-GM
Program Memory Type
FLASH
Program Memory Size
32KB (32K x 8)
Package / Case
32-QFN
Core Processor
8051
Core Size
8-Bit
Speed
48MHz
Connectivity
SMBus (2-Wire/I²C), SPI, UART/USART, USB
Peripherals
Brown-out Detect/Reset, POR, PWM, Temp Sensor, WDT
Number Of I /o
25
Ram Size
2.25K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 3.6 V
Data Converters
A/D 17x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Processor Series
C8051F3x
Core
8051
Data Bus Width
8 bit
Data Ram Size
2304 B
Interface Type
I2C, SPI, UART
Maximum Clock Frequency
25 MHz
Number Of Programmable I/os
25
Number Of Timers
4
Operating Supply Voltage
2.7 V to 5.25 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
KSK-SL-F34X, KSK-SL-TOOLSTICK, PK51, CA51, A51, ULINK2
Development Tools By Supplier
C8051F340DK
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
For Use With
336-1748 - ADAPTER TOOLSTICK FOR C8051F34X
Eeprom Size
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Other names
336-1351-5
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
C8051F34B-GM
Manufacturer:
Silicon Labs
Quantity:
135
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C8051F340/1/2/3/4/5/6/7/8/9/A/B/C/D
2.
24
Ambient temperature under bias
Storage Temperature
Voltage on any Port I/O Pin or RST with
respect to GND
Voltage on V
Maximum Total current through V
GND
Maximum output current sunk by RST or any
Port pin
*Note: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the
Absolute Maximum Ratings
device. This is a stress rating only and functional operation of the devices at those or any other conditions
above those indicated in the operation listings of this specification is not implied. Exposure to maximum rating
conditions for extended periods may affect device reliability.
DD
with respect to GND
Parameter
Table 2.1. Absolute Maximum Ratings*
DD
and
Rev. 1.3
Conditions
–0.3
–0.3
Min
–55
–65
Typ
Max
125
150
500
100
5.8
4.2
Units
mA
mA
°C
°C
V
V
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