PIC18LF25K22-I/SP Microchip Technology, PIC18LF25K22-I/SP Datasheet - Page 323
![no-image](/images/manufacturer_photos/0/4/439/microchip_technology_sml.jpg)
PIC18LF25K22-I/SP
Manufacturer Part Number
PIC18LF25K22-I/SP
Description
MCU 8BIT 32KB FLASH 3.6V 28SDIP
Manufacturer
Microchip Technology
Series
PIC® XLP™ 18Fr
Datasheets
1.PIC18F26J13-ISS.pdf
(496 pages)
2.PIC18F25K22T-ISS.pdf
(10 pages)
3.PIC18F25K22-ISP.pdf
(492 pages)
Specifications of PIC18LF25K22-I/SP
Program Memory Type
FLASH
Program Memory Size
32KB (16K x 16)
Package / Case
28-DIP (0.300", 7.62mm)
Core Processor
PIC
Core Size
8-Bit
Speed
64MHz
Connectivity
I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, HLVD, POR, PWM, WDT
Number Of I /o
24
Eeprom Size
256 x 8
Ram Size
1.5K x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 3.6 V
Data Converters
A/D 19x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Processor Series
PIC18LF
Core
PIC
Data Bus Width
8 bit
Data Ram Size
1536 B
Interface Type
I2C, SPI, EUSART
Maximum Clock Frequency
64 MHz
Number Of Programmable I/os
25
Number Of Timers
7
Operating Supply Voltage
1.8 V to 3.6 V
Maximum Operating Temperature
+ 85 C
Mounting Style
Through Hole
3rd Party Development Tools
52715-96, 52716-328, 52717-734, 52712-325, EWPIC18
Development Tools By Supplier
PG164130, DV164005
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit, 17 Channel
On-chip Dac
5 bit
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
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19.3.2
There is a small amount of capacitance from the
internal A/D Converter sample capacitor as well as
stray capacitance from the circuit board traces and
pads that affect the precision of capacitance
measurements.
capacitance can be taken by making sure the desired
capacitance to be measured has been removed. The
measurement is then performed using the following
steps:
1.
2.
3.
4.
5.
6.
where I is known from the current source measurement
step, t is a fixed delay and V is measured by performing
an A/D conversion.
This measured value is then stored and used for
calculations of time measurement or subtracted for
capacitance measurement. For calibration, it is
expected that the capacitance of C
approximately known. C
An iterative process may need to be used to adjust the
time, t, that the circuit is charged to obtain a reasonable
voltage reading from the A/D Converter. The value of t
may be determined by setting C
value, then solving for t. For example, if C
theoretically calculated to be 11 pF, and V is expected
to be 70% of V
or 63 s.
See Example 19-3 for a typical routine for CTMU
capacitance calibration.
2010 Microchip Technology Inc.
Initialize the A/D Converter and the CTMU.
Set EDG1STAT (= 1).
Wait for a fixed delay of time t.
Clear EDG1STAT.
Perform an A/D conversion.
Calculate the stray and A/D sample capacitances:
C
OFFSET
CAPACITANCE CALIBRATION
(4 pF + 11 pF) • 2.31V/0.55 A
DD
, or 2.31V, then t would be:
A
=
C
measurement
STRAY
AD
is approximately 4 pF.
+
C
OFFSET
AD
=
STRAY
of
to a theoretical
I t
V
the
+ C
STRAY
AD
stray
Preliminary
is
is
PIC18(L)F2X/4XK22
DS41412B-page 323
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