PIC18LF25K22-I/SP Microchip Technology, PIC18LF25K22-I/SP Datasheet - Page 325
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PIC18LF25K22-I/SP
Manufacturer Part Number
PIC18LF25K22-I/SP
Description
MCU 8BIT 32KB FLASH 3.6V 28SDIP
Manufacturer
Microchip Technology
Series
PIC® XLP™ 18Fr
Datasheets
1.PIC18F26J13-ISS.pdf
(496 pages)
2.PIC18F25K22T-ISS.pdf
(10 pages)
3.PIC18F25K22-ISP.pdf
(492 pages)
Specifications of PIC18LF25K22-I/SP
Program Memory Type
FLASH
Program Memory Size
32KB (16K x 16)
Package / Case
28-DIP (0.300", 7.62mm)
Core Processor
PIC
Core Size
8-Bit
Speed
64MHz
Connectivity
I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, HLVD, POR, PWM, WDT
Number Of I /o
24
Eeprom Size
256 x 8
Ram Size
1.5K x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 3.6 V
Data Converters
A/D 19x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Processor Series
PIC18LF
Core
PIC
Data Bus Width
8 bit
Data Ram Size
1536 B
Interface Type
I2C, SPI, EUSART
Maximum Clock Frequency
64 MHz
Number Of Programmable I/os
25
Number Of Timers
7
Operating Supply Voltage
1.8 V to 3.6 V
Maximum Operating Temperature
+ 85 C
Mounting Style
Through Hole
3rd Party Development Tools
52715-96, 52716-328, 52717-734, 52712-325, EWPIC18
Development Tools By Supplier
PG164130, DV164005
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit, 17 Channel
On-chip Dac
5 bit
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
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19.4
There are two separate methods of measuring
capacitance with the CTMU. The first is the absolute
method, in which the actual capacitance value is
desired. The second is the relative method, in which
the actual capacitance is not needed, rather an
indication of a change in capacitance is required.
19.4.1
For absolute capacitance measurements, both the
current and capacitance calibration steps found in
Section 19.3 “Calibrating the CTMU Module”
should be followed. Capacitance measurements are
then performed using the following steps:
1.
2.
3.
4.
5.
6.
7.
8.
2010 Microchip Technology Inc.
Initialize the A/D Converter.
Initialize the CTMU.
Set EDG1STAT.
Wait for a fixed delay, T.
Clear EDG1STAT.
Perform an A/D conversion.
Calculate the total capacitance, C
where I is known from the current source
measurement step (see Section 19.3.1 “Current
Source Calibration”), T is a fixed delay and V is
measured by performing an A/D conversion.
Subtract the stray and A/D capacitance
(C
Calibration”) from C
measured capacitance.
OFFSET
Measuring Capacitance with the
CTMU
ABSOLUTE CAPACITANCE
MEASUREMENT
from Section 19.3.2 “Capacitance
TOTAL
to determine the
TOTAL
= (I * T)/V,
Preliminary
19.4.2
An application may not require precise capacitance
measurements. For example, when detecting a valid
press of a capacitance-based switch, detecting a rela-
tive change of capacitance is of interest. In this type of
application, when the switch is open (or not touched),
the total capacitance is the capacitance of the combina-
tion of the board traces, the A/D Converter, etc. A larger
voltage will be measured by the A/D Converter. When
the switch is closed (or is touched), the total
capacitance is larger due to the addition of the
capacitance of the human body to the above listed
capacitances, and a smaller voltage will be measured
by the A/D Converter.
Detecting capacitance changes is easily accomplished
with the CTMU using these steps:
1.
2.
3.
4.
5.
The voltage measured by performing the A/D
conversion is an indication of the relative capacitance.
Note that in this case, no calibration of the current
source or circuit capacitance measurement is needed.
See Example 19-4 for a sample software routine for a
capacitive touch switch.
PIC18(L)F2X/4XK22
Initialize the A/D Converter and the CTMU.
Set EDG1STAT.
Wait for a fixed delay.
Clear EDG1STAT.
Perform an A/D conversion.
RELATIVE CHARGE
MEASUREMENT
DS41412B-page 325
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