ATXMEGA16A4-CUR Atmel, ATXMEGA16A4-CUR Datasheet - Page 41

MCU AVR 16+4KB FLASH 49VFBGA

ATXMEGA16A4-CUR

Manufacturer Part Number
ATXMEGA16A4-CUR
Description
MCU AVR 16+4KB FLASH 49VFBGA
Manufacturer
Atmel
Series
AVR® XMEGAr
Datasheets

Specifications of ATXMEGA16A4-CUR

Core Processor
AVR
Core Size
8/16-Bit
Speed
32MHz
Connectivity
I²C, IrDA, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, DMA, POR, PWM, WDT
Number Of I /o
34
Program Memory Size
16KB (8K x 16)
Program Memory Type
FLASH
Eeprom Size
1K x 8
Ram Size
2K x 8
Voltage - Supply (vcc/vdd)
1.6 V ~ 3.6 V
Data Converters
A/D 12x12b, D/A 2x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
49-VFBGA
For Use With
ATAVRONEKIT - KIT AVR/AVR32 DEBUGGER/PROGRMMRATSTK600 - DEV KIT FOR AVR/AVR32770-1007 - ISP 4PORT ATMEL AVR MCU SPI/JTAG770-1004 - ISP 4PORT FOR ATMEL AVR MCU SPI
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ATXMEGA16A4-CUR
Manufacturer:
Atmel
Quantity:
10 000
25. ADC - 12-bit Analog to Digital Converter
25.1
25.2
8069Q–AVR–12/10
Features
Overview
XMEGA A4 devices have one Analog to Digital Converter (ADC), see
The ADC converts analog voltages to digital values. The ADC has 12-bit resolution and is capa-
ble of converting up to 2 million samples per second. The input selection is flexible, and both
single-ended and differential measurements can be done. For differential measurements an
optional gain stage is available to increase the dynamic range. In addition several internal signal
inputs are available. The ADC can provide both signed and unsigned results.
This is a pipeline ADC. A pipeline ADC consists of several consecutive stages, where each
stage convert one part of the result. The pipeline design enables high sample rate at low clock
speeds, and remove limitations on samples speed versus propagation delay. This also means
that a new analog voltage can be sampled and a new ADC measurement started while other
ADC measurements are ongoing.
ADC measurements can either be started by application software or an incoming event from
another peripheral in the device. Four different result registers with individual input selection
(MUX selection) are provided to make it easier for the application to keep track of the data. Each
result register and MUX selection pair is referred to as an ADC Channel. It is possible to use
DMA to move ADC results directly to memory or peripherals when conversions are done.
Both internal and external analog reference voltages can be used. An accurate internal 1.0V
reference is available.
An integrated temperature sensor is available and the output from this can be measured with the
ADC. The output from the DAC, VCC/10 and the Bandgap voltage can also be measured by the
ADC.
One ADC with 12-bit resolution
2 Msps sample rate
Signed and Unsigned conversions
4 result registers with individual input channel control
12 single ended inputs
8x4 differential inputs
4 internal inputs:
Software selectable gain of 2, 4, 8, 16, 32 or 64
Selectable accuracy of 8- or 12-bit.
Internal or External Reference selection
Event triggered conversion for accurate timing
DMA transfer of conversion results
Interrupt/Event on compare result
Integrated Temperature Sensor
DAC Output
VCC voltage divided by 10
Bandgap voltage
Figure 25-1 on page
XMEGA A4
42.
41

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