PIC18F87K22-I/PTRSL Microchip Technology, PIC18F87K22-I/PTRSL Datasheet - Page 392
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PIC18F87K22-I/PTRSL
Manufacturer Part Number
PIC18F87K22-I/PTRSL
Description
MCU PIC 128K FLASH XLP 80TQFP
Manufacturer
Microchip Technology
Series
PIC® XLP™ 18Fr
Datasheets
1.PIC16F722-ISS.pdf
(8 pages)
2.PIC18F65K22T-IPTRSL.pdf
(548 pages)
3.PIC18F65K22T-IPTRSL.pdf
(10 pages)
Specifications of PIC18F87K22-I/PTRSL
Core Processor
PIC
Core Size
8-Bit
Speed
64MHz
Connectivity
EBI/EMI, I²C, LIN, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, LVD, POR, PWM, WDT
Number Of I /o
69
Program Memory Size
128KB (64K x 16)
Program Memory Type
FLASH
Eeprom Size
1K x 8
Ram Size
4K x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 5.5 V
Data Converters
A/D 24x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
80-TFQFP
Processor Series
PIC18F
Core
PIC
3rd Party Development Tools
52715-96, 52716-328, 52717-734, 52712-325, EWPIC18
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
PIC18F87K22-I/PTRSL
Manufacturer:
Microchip Technology
Quantity:
10 000
- PIC16F722-ISS PDF datasheet
- PIC18F65K22T-IPTRSL PDF datasheet #2
- PIC18F65K22T-IPTRSL PDF datasheet #3
- Current page: 392 of 548
- Download datasheet (5Mb)
PIC18F87K22 FAMILY
27.4.2
There is a small amount of capacitance from the inter-
nal A/D Converter sample capacitor as well as stray
capacitance from the circuit board traces and pads that
affect the precision of capacitance measurements. A
measurement of the stray capacitance can be taken by
making sure the desired capacitance to be measured
has been removed.
After removing the capacitance to be measured:
1.
2.
3.
4.
5.
6.
Where:
• I is known from the current source measurement
• t is a fixed delay
• V is measured by performing an A/D conversion
DS39960B-page 392
step
Initialize the A/D Converter and the CTMU.
Set EDG1STAT (= 1 ).
Wait for a fixed delay of time, t .
Clear EDG1STAT.
Perform an A/D conversion.
Calculate the stray and A/D sample capacitances:
C
CAPACITANCE CALIBRATION
OFFSET
= C
STRAY
+ C
AD
= (I • t)/V
Preliminary
This measured value is then stored and used for
calculations of time measurement or subtracted for
capacitance measurement. For calibration, it is
expected that the capacitance of C
approximately known; C
An iterative process may be required to adjust the time,
t , that the circuit is charged to obtain a reasonable volt-
age reading from the A/D Converter. The value of t may
be determined by setting C
and solving for t . For example, if C
calculated to be 11 pF, and V is expected to be 70% of
V
or 63 s.
See Example 27-3 for a typical routine for CTMU
capacitance calibration.
DD
or 2.31V, t would be:
(4 pF + 11 pF) • 2.31V/0.55 A
2010 Microchip Technology Inc.
AD
OFFSET
is approximately 4 pF.
to a theoretical value
STRAY
STRAY
is theoretically
+ C
AD
is
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