SP485EMN-L Exar Corporation, SP485EMN-L Datasheet - Page 8

IC TXRX RS485 HALF DUPLEX 8NSOIC

SP485EMN-L

Manufacturer Part Number
SP485EMN-L
Description
IC TXRX RS485 HALF DUPLEX 8NSOIC
Manufacturer
Exar Corporation
Type
Transceiverr
Datasheet

Specifications of SP485EMN-L

Package / Case
8-SOIC (0.154", 3.90mm Width)
Number Of Drivers/receivers
1/1
Protocol
RS485
Voltage - Supply
5V
Mounting Type
Surface Mount
Operating Supply Voltage
5 V
Supply Current
600 uA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
1016-1173-5

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Part Number
Manufacturer
Quantity
Price
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SP485EMN-L
Manufacturer:
SIPEX
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Part Number:
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Manufacturer:
SIPEX
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Part Number:
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The Human Body Model has been the
generally accepted ESD testing method
for semiconductors. This method is also
specified in MIL-STD-883, Method 3015.7
for ESD testing. The premise of this ESD
test is to simulate the human body’s potential
to store electro-static energy and discharge
it to an integrated circuit. The simulation is
performed by using a test model as shown
in Figure 9. This method will test the IC’s
capability to withstand an ESD transient dur-
ing normal handling such as in manufactur-
ing areas where the ICs tend to be handled
frequently.
IEC801-2, is generally used for testing ESD
on equipment and systems.
Figure 10. ESD Test Circuit for IEC1000-4-2
Figure 9. ESD Test Circuit for Human Body Model
DC Power
DC Power
Source
Source
The IEC-000-4-2, formerly
Exar Corporation 48720 Kato Road, Fremont CA, 94538 • 50-668-707 • www.exar.com
R
R
C
C
SW1
SW1
C
C
8
S
S
R S and R V add up to 330Ω for IEC1000-4-2.
For system manufacturers, they must guar-
antee a certain amount of ESD protection
since the system itself is exposed to the
outside environment and human presence.
The premise with IEC1000-4-2 is that the
system is required to withstand an amount
of static electricity when ESD is applied to
points and surfaces of the equipment that
are accessible to personnel during normal
usage. The transceiver IC receives most
of the ESD current when the ESD source is
applied to the connector pins. The test cir-
cuit for IEC1000-4-2 is shown on Figure 10.
There are two methods within IEC1000-4-2,
the Air Discharge method and the Contact
Discharge method.
R
R
S
S
Contact-Discharge Model
R
V
SW2
SW2
SP48E,485E_02_08080
Device
Under
Device
Under
Test
Test

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