RE46C190S16F Microchip Technology, RE46C190S16F Datasheet - Page 16
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RE46C190S16F
Manufacturer Part Number
RE46C190S16F
Description
MOSFET & Power Driver ICs 3V E-Cal Photo S.D. IC
Manufacturer
Microchip Technology
Type
CMOS Photoelectric Smoke Detector ASIC with Interconnect and Timer Moder
Datasheet
1.RE46C190S16F.pdf
(42 pages)
Specifications of RE46C190S16F
Product
Driver ICs - Various
Supply Voltage (max)
5 V
Supply Voltage (min)
2 V
Supply Current
1 uA
Maximum Operating Temperature
+ 60 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 10 C
Output Current
- 4 mA
Output Voltage
8.5 V
Package / Case
SOIC-16
Input Voltage
5V
Ic Output Type
Open Drain
Sensor Case Style
SOIC
No. Of Pins
16
Supply Voltage Range
2V To 5V
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
RE46C190S16F
Manufacturer:
MCP
Quantity:
50
Company:
Part Number:
RE46C190S16F
Manufacturer:
MICROCHIP
Quantity:
12 000
RE46C190
4.1
Eleven separate programming and test modes are
available for user customization. To enter these modes,
after power-up, TEST2 must be driven to V
at that level. The TEST input is then clocked to step
through the modes. FEED and IO are reconfigured to
become test mode inputs, while RLED, GLED and HB
become test mode outputs. The test mode functions for
each pin are outlined in
TABLE 4-3:
DS22271A-page 16
Note 1:
T10 Ch Test Lim Check
T11 Horn Test
T0 Photo Gain Factor
T1 Norm Lim Set
T2 Hyst Lim Set
T3 Hush Lim Set
T4 Ch Test Lim Set
T5 LTD Baseline (5 bits)
T6 Serial Read/Write
T7 Norm Lim Check
T8 Hyst Lim Check
T9 Hush Lim Check
V
(2 bits)
Integ Time (2 bits)
IRED Current (2 bits)
Low Battery Trip
(3 bits)
LTD Enable (1 bit)
Hush Option (1 bit)
LB Hush Enable
(1 bit)
EOL Enable (1 bit)
Tone Select (1 bit)
(5 bits)
(5 bits)
(5 bits)
(5 bits)
2:
3:
4:
V
IH
IL
Calibration and Programming
Procedures
Description
SmkComp (HB) – digital comparator output (high if Gamp < IntegOut; low if Gamp > IntegOut)
SCMP (HB) – digital output representing comparison of measurement value and associated limit. Signal is
valid only after MeasEn has been asserted and measurement has been made. (SCMP high if measured
value > limit; low if measured value < limit).
LatchLim (IO) – digital input used to latch present state of limits (Gamp level) for later storage. T1-T4 limits
are latched, but not stored until ProgEn is asserted in T5 mode.
Operating the circuit in this manner with nearly continuous IRED current for an extended period of time
may result in undesired or excessive heating of the part. The duration of this step should be minimized.
(
(
(
(
4
4
4
4
)
)
)
)
TEST MODE FUNCTIONS
Table
Clock
TEST
4-3.
V
V
10
11
BST
0
0
0
0
0
0
0
0
0
1
2
3
4
5
6
7
8
9
SS
ProgData
ProgData
ProgData
ProgData
ProgData
ProgData
ProgData
ProgData
ProgData
ProgData
not used
not used
not used
not used
not used
not used
not used
not used
not used
not used
TEST
Data
V
V
DD
SS
DD
and held
TEST2
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
DD
DD
DD
DD
DD
DD
DD
DD
DD
DD
DD
DD
DD
DD
DD
DD
DD
DD
DD
DD
DD
SS
ProgCLK ProgEn 14 bits RLED
ProgCLK ProgEn 14 bits RLED
ProgCLK ProgEn 14 bits RLED
ProgCLK ProgEn 14 bits RLED
ProgCLK ProgEn 14 bits RLED
ProgCLK ProgEn 14 bits RLED
ProgCLK ProgEn 14 bits RLED
ProgCLK ProgEn 14 bits RLED
ProgCLK ProgEn 14 bits RLED
ProgCLK
MeasEn ProgEn 25 bits Gamp IntegOut SmkComp
MeasEn
MeasEn
MeasEn
MeasEn
CalCLK
CalCLK
CalCLK
CalCLK
FEED
FEED
V
V
BST
SS
When TEST2 is held at V
input with nominal input levels at V
TEST clock occurs whenever the TEST input switches
from V
the state of TEST when used as a data input, which
would be either V
therefore be used as both a clock, to change modes,
and a data input, once a mode is set. Other pin
functions
Selections”.
LatchLim
LatchLim
LatchLim
LatchLim
SS
not used
not used
not used
not used
HornEn
ProgEn
to V
V
V
IO
are
DD
SS
BST
(
(
(
(
3
3
3
3
described
. The TEST Data column represents
)
)
)
)
SS
RLED
Gamp IntegOut SmkComp
Gamp IntegOut SmkComp
Gamp IntegOut SmkComp
Gamp IntegOut SmkComp
Gamp IntegOut
Gamp IntegOut
Gamp IntegOut
Gamp IntegOut
RLED
RLED
—
—
or V
2010 Microchip Technology Inc.
DD
, TEST becomes a tri-state
DD
in
GLED
GLED
GLED
GLED
GLED
GLED
GLED
GLED
GLED
GLED
GLED
GLED
. The TEST pin can
—
—
Section 4.2
SS
, V
DD
Serial Out
SCMP
SCMP
SCMP
SCMP
and V
HB
HB
HB
HB
HB
HB
HB
HB
HB
HB
HB
—
—
“User
(
(
(
(
BST
2
2
2
2
(
(
(
(
(
)
)
)
)
1
1
1
1
1
. A
)
)
)
)
)