74AUP2G38GD,125 NXP Semiconductors, 74AUP2G38GD,125 Datasheet - Page 10

IC GATE NAND DUAL INPUT XSON8U

74AUP2G38GD,125

Manufacturer Part Number
74AUP2G38GD,125
Description
IC GATE NAND DUAL INPUT XSON8U
Manufacturer
NXP Semiconductors
Datasheet

Specifications of 74AUP2G38GD,125

Product
NAND
Number Of Gates
2
Propagation Delay Time
4.9 ns, 6.5 ns, 8.2 ns, 12.6 ns
Supply Voltage (max)
4.6 V
Maximum Operating Temperature
+ 125 C
Mounting Style
SMD/SMT
Package / Case
XSON-8U
Minimum Operating Temperature
- 40 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
568-5411-2
NXP Semiconductors
Table 10.
[1]
74AUP2G38
Product data sheet
Supply voltage
V
0.8 V to 3.6 V
Fig 9.
CC
For measuring enable and disable times R
For measuring propagation delays, set-up times, hold times and pulse width, R
Test data is given in
Definitions for test circuit:
R
C
R
V
Test circuit for measuring switching times
L
L
T
EXT
Test data
= Load resistance.
= Load capacitance including jig and probe capacitance.
= Termination resistance should be equal to the output impedance Z
= External voltage for measuring switching times.
Load
C
5 pF, 10 pF, 15 pF and 30 pF
L
Table
10.
L
All information provided in this document is subject to legal disclaimers.
G
= 5 kΩ.
Rev. 5 — 23 September 2010
V I
R T
R
5 kΩ or 1 MΩ
L
DUT
V
[1]
CC
V O
Low-power dual 2-input NAND gate; open drain
C L
o
L
001aac521
of the pulse generator.
= 1 MΩ.
V
t
open
V
PLH
EXT
EXT
5 kΩ
R L
, t
PHL
t
GND
PZH
74AUP2G38
, t
PHZ
© NXP B.V. 2010. All rights reserved.
t
2V
PZL
CC
, t
PLZ
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