IS61NLP25636A-200TQLI INTEGRATED SILICON SOLUTION (ISSI), IS61NLP25636A-200TQLI Datasheet - Page 27

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IS61NLP25636A-200TQLI

Manufacturer Part Number
IS61NLP25636A-200TQLI
Description
IC, SRAM, 9MBIT, 3.1NS, TQFP-100
Manufacturer
INTEGRATED SILICON SOLUTION (ISSI)

Specifications of IS61NLP25636A-200TQLI

Memory Size
9Mbit
Memory Configuration
256K X 8
Clock Frequency
200MHz
Access Time
3.1ns
Supply Voltage Range
3.135V To 3.465V
Memory Case Style
TQFP
No. Of Pins
100
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
IS61NLP25636A-200TQLI
Manufacturer:
ISSI, Integrated Silicon Solution Inc
Quantity:
10 000
Part Number:
IS61NLP25636A-200TQLI
Manufacturer:
ISSI
Quantity:
20 000
Part Number:
IS61NLP25636A-200TQLI-TR
Manufacturer:
ISSI, Integrated Silicon Solution Inc
Quantity:
10 000
IS61NLP25636A/IS61NVP25636A
IS61NLP51218A/IS61NVP51218A
TAP Electrical Characteristics Over the Operating Range
Notes:
TAP AC ELECTRICAL CHARACTERISTICS
Notes:
1. Both t
2. Test conditions are specified using the load in TAP AC test conditions. t
Integrated Silicon Solution, Inc. — www.issi.com —
Rev. G
07/28/2010
Symbol
V
V
V
V
V
V
I
1. All Voltage referenced to Ground.
2. Overshoot: V
x
oh1
oh2
ol1
ol2
Symbol Parameter
t
f
t
t
t
t
t
t
t
t
t
t
Ih
Il
Tcyc
Tf
Th
Tl
TMSS
TdIS
cS
TMSh
TdIh
ch
TdoV
Tdox
Undershoot: V
Power-up: V
cS
and t
TCK Clock cycle time
TCK Clock frequency
TCK Clock HIGH
TCK Clock LOW
TMS setup to TCK Clock Rise
TDI setup to TCK Clock Rise
Capture setup to TCK Rise
TMS hold after TCK Clock Rise
TDI Hold after Clock Rise
Capture hold after Clock Rise
TCK LOW to TDO valid
TCK LOW to TDO invalid
ch
Ih
Ih
Il
< 2.6V and V
refer to the set-up and hold time requirements of latching data from the boundary scan register.
(AC) ≤ V
(AC)
Parameter
Output HIGH Voltage
Output HIGH Voltage
Output LOW Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input Leakage Current
0.5V for t
dd
+1.5V for t
dd
< 2.4V and V
t
Tcyc
t
Tcyc
/2,
ddq
/2,
< 1.4V for t < 200 ms.
(1,2)
1-800-379-4774
(OVER OPERATING RANGE)
Test Conditions
V
I
I
SS
oh
oh
I
I
ol
ol
≤ V I ≤ V
= –2.0 mA
= –100 µA
= 2.0 mA
= 100 µA
r
/t
f
= 1 ns.
(1,2)
ddq
Min.
100
40
40
10
10
10
10
10
10
0
Max.
10
20
Min.
–0.3
–10
1.7
2.1
1.7
V
dd
Max.
0.7
0.2
0.7
MHz
Unit
10
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
+0.3
Units
µA
V
V
V
V
V
V
27

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