ULN2803AFWG Toshiba, ULN2803AFWG Datasheet

Page 1

... Package Type−AFWG : SOL−18pin Input Base Type Resistor ULN2803APG / AFWG 2.7 kΩ ULN2804APG / AFWG 10.5 kΩ ULN2803APG ULN2804APG ULN2803AFWG ULN2804AFWG Weight DIP18−P−300−2.54F : 1.478 g (Typ.) SOL18−P−300−1.27 : 0.48 g (Typ.) Pin Connection Designation TTL CMOS 6~15 V PMOS, CMOS 1 ULN2803,04APG/AFWG ...

Page 2

Schematics (each driver) ULN2803APG / AFWG Note: The input and output parasitic diodes cannot be used as clamp diodes. Absolute Maximum Ratings Characteristic Output sustaining voltage Output current Input voltage Clamp diode reverse voltage Clamp diode forward current APG Power ...

Page 3

Recommended Operating Conditions Characteristic Output sustaining voltage APG Output current AFWG Input voltage ULN2803A Input voltage (Output on) ULN2804A Clamp diode reverse voltage Clamp diode forward current APG Power dissipation AFWG Note: On Glass Epoxy PCB (75 × 114 × ...

Page 4

Electrical Characteristics Characteristic Output leakage current ULN2804A Collector−emitter saturation voltage ULN2803A Input current ULN2804A ULN2803A Input voltage (Output on) ULN2804A DC current transfer ratio Clamp diode reverse current Clamp diode forward voltage Input capacitance Turn−on delay Turn−off delay Note: V ...

Page 5

Test Circuit 1. I CEX (OFF (sat (ON) 5 ULN2803,04APG/AFWG ( 2010-12-03 ...

Page 6

ON OFF Note 1: Pulse Width 50 μs, Duty Cycle 10% Output Impedance 50 Ω, t Note 2: See below. Input Condition Type Number ULN2803A ULN2804A Note 3: C includes probe and jig capacitance L Precautions ...

Page 7

ULN2803,04APG/AFWG 7 2010-12-03 ...

Page 8

ULN2803,04APG/AFWG 8 2010-12-03 ...

Page 9

Package Dimensions DIP18−P−300−2.54F Weight: 1.478 g (Typ.) ULN2803,04APG/AFWG 9 Unit: mm 2010-12-03 ...

Page 10

Package Dimensions SOL18−P−300−1.27 Weight: 0.48 g (Typ.) ULN2803,04APG/AFWG 10 Unit: mm 2010-12-03 ...

Page 11

Notes on Contents 1. Equivalent Circuits The equivalent circuit diagrams may be simplified or some parts of them may be omitted for explanatory purposes. 2. Test Circuits Components in the test circuits are used only to obtain and confirm the ...

Page 12

Points to Remember on Handling of ICs (1) Heat Radiation Design In using an IC with large current flow such as power amp, regulator or driver, please design the device so that heat is appropriately radiated, not to exceed the ...

Page 13

... Product shall not be used for or incorporated into any products or systems whose manufacture, use, or sale is prohibited under any applicable laws or regulations. • The information contained herein is presented only as guidance for Product use. No responsibility is assumed by TOSHIBA for any infringement of patents or any other intellectual property rights of third parties that may result from the use of Product. No license to any intellectual property right is granted by this document, whether express or implied, by estoppel or otherwise. • ...