AD12401-326JWS Analog Devices Inc, AD12401-326JWS Datasheet - Page 8

• Manufacturer Part Number: AD12401-326JWS
• Description: IC,A/D CONVERTER,DUAL,12-BIT,MODULE
• Manufacturer: Analog Devices Inc

Specifications of AD12401-326JWS

• Number Of Bits: 12
• Sampling Rate (per Second): 326M
• Data Interface: Parallel
• Number Of Converters: 2
• Power Dissipation (max): 6.8W
• Voltage Supply Source: Analog and Digital
• Operating Temperature: 0°C ~ 60°C
• Package / Case: Module
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

AD12401
ABSOLUTE MAXIMUM RATINGS
Table 5.
Parameter
VA to AGND
VC to DGND
VD to DGND
Analog Input Voltage
Analog Input Power
ENCODE Input Voltage
ENCODE Input Power
Logic Inputs
Storage Temperature Range, Ambient
Operating Temperature Range
EXPLANATION OF TEST LEVELS
Table 6.
Level
I
II
III
IV
V
VI
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Description
100% production tested.
100% production tested at 25°C and sample tested at specified temperatures.
Sample tested only.
Parameter is guaranteed by design and characterization testing.
Parameter is a typical value only.
100% production tested at 25°C; guaranteed by design and characterization testing for industrial temperature range; 100%
production tested at temperature extremes for military devices.
Value
5 V
4 V
1.6 V max
6 V (dc)
18 dBm (ac)
6 V (dc)
12 dBm (ac)
−0.3 V to +4 V
−65°C to +150°C
0°C to 60°C
Rev. A | Page 8 of 28
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.