ADV7183BBSTZ Analog Devices Inc, ADV7183BBSTZ Datasheet - Page 10

IC,TV/VIDEO CIRCUIT,Color Decoder Circuit,CMOS,QFP,80PIN,PLASTIC

ADV7183BBSTZ

Manufacturer Part Number
ADV7183BBSTZ
Description
IC,TV/VIDEO CIRCUIT,Color Decoder Circuit,CMOS,QFP,80PIN,PLASTIC
Manufacturer
Analog Devices Inc
Type
Video Decoderr
Datasheet

Specifications of ADV7183BBSTZ

Applications
Projectors, Recorders, Security
Voltage - Supply, Analog
3.15 V ~ 3.45 V
Voltage - Supply, Digital
1.65 V ~ 2 V
Mounting Type
Surface Mount
Package / Case
80-LQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

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Manufacturer:
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ADV7183B
ABSOLUTE MAXIMUM RATINGS
Table 6.
Parameter
A
A
D
P
D
D
P
D
D
A
A
Digital Inputs Voltage to DGND
Digital Output Voltage to DGND
Analog Input to AGND
Maximum Junction Temperature
Storage Temperature Range
Infrared Reflow Soldering (20 sec)
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
VDD
VDD
VDD
VDD
VDD
VDDIO
VDDIO
VDDIO
VDDIO
VDD
VDD
(T
to AGND
to D
J
to GND
to AGND
– P
– D
to DGND
max)
to DGND
to A
– P
– D
VDD
VDD
VDD
VDD
VDD
VDD
Rating
4 V
4 V
2.2 V
2.2 V
4 V
–0.3 V to +0.3 V
–0.3 V to +0.3 V
–0.3 V to +2 V
–0.3 V to +2 V
–0.3 V to +2 V
–0.3 V to +2 V
–0.3 V to D
–0.3 V to D
AGND – 0.3 V to A
150°C
–65°C to +150°C
260°C
VDDIO
VDDIO
+ 0.3 V
+ 0.3 V
VDD
+ 0.3 V
Rev. B | Page 10 of 100
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.

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