CY7C1423AV18-250BZC Cypress Semiconductor Corp, CY7C1423AV18-250BZC Datasheet - Page 24

• Manufacturer Part Number: CY7C1423AV18-250BZC
• Description: SRAM (Static RAM)
• Manufacturer: Cypress Semiconductor Corp

Specifications of CY7C1423AV18-250BZC

• Format - Memory: RAM
• Memory Type: SRAM - Synchronous, DDR II
• Memory Size: 36M (2M x 18)
• Speed: 250MHz
• Interface: Parallel
• Voltage - Supply: 1.7 V ~ 1.9 V
• Operating Temperature: 0°C ~ 70°C
• Package / Case: 165-TFBGA
• Density: 36Mb
• Access Time (max): 0.45ns
• Sync/async: Synchronous
• Architecture: DDR
• Clock Freq (max): 250MHz
• Operating Supply Voltage (typ): 1.8V
• Address Bus: 20b
• Package Type: FBGA
• Operating Temp Range: 0C to 70C
• Number Of Ports: 2
• Supply Current: 740mA
• Operating Supply Voltage (min): 1.7V
• Operating Supply Voltage (max): 1.9V
• Operating Temperature Classification: Commercial
• Mounting: Surface Mount
• Pin Count: 165
• Word Size: 18b
• Number Of Words: 2M
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

Capacitance
Tested initially and after any design or process change that may affect these parameters.
Thermal Resistance
Tested initially and after any design or process change that may affect these parameters.
Note
Document Number: 38-05617 Rev. *I
C
C
C
26. Unless otherwise noted, test conditions are based on signal transition time of 2 V/ns, timing reference levels of 0.75 V, Vref = 0.75 V, RQ = 250 , V
Parameter
Parameter
IN
CLK
O
pulse levels of 0.25 V to 1.25 V, and output loading of the specified I


JA
JC
OUTPUT
Device
Under
Test
V
REF
ZQ
Input Capacitance
Clock Input Capacitance
Output Capacitance
Thermal Resistance
(Junction to Ambient)
Thermal Resistance
(Junction to Case)
(a)
Z
RQ =
250 
0.75 V
0
= 50
Description
Description
V
REF
R
L
= 0.75 V
= 50 
Figure 4. AC Test Loads and Waveforms
INCLUDING
T
Test conditions follow standard test methods and
procedures for measuring thermal impedance, in
accordance with EIA/JESD51.
Device
Under
Test
OUTPUT
A
JIG AND
SCOPE
= 25 C, f = 1 MHz, V
V
REF
ZQ
OL
/I
OH
and load capacitance shown in (a) of
0.75 V
RQ =
250
(b)
Test Conditions
Test Conditions
V
REF
= 0.75 V
DD
R = 50 
5 pF
= 1.8 V, V
CY7C1422AV18, CY7C1429AV18
CY7C1423AV18, CY7C1424AV18
0.25 V
DDQ
= 1.5 V
AC Test Loads and
1.25 V
Slew Rate = 2 V/ns
ALL INPUT PULSES
0.75 V
165 FBGA
Package
Max
17.2
3.2
Waveforms.
5
4
5
[26]
DDQ
Page 24 of 33
°C/W
°C/W
= 1.5 V, input
Unit
Unit
pF
pF
pF
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