SKP02N120 Infineon Technologies, SKP02N120 Datasheet
SKP02N120
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SKP02N120 Summary of contents
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... Allowed number of short circuits: <1000; time between short circuits: >1s. Power Semiconductors for target applications http://www.infineon.com/igbt Marking C off j 0.11mJ K02N120 150 C Symbol jmax jmax 150 SKP02N120 G PG-TO-220-3-1 (TO-220AB) Package PG-TO-220-3-1 Value 1200 C E 6.2 2.8 9.6 9.6 4 -55...+150 260 s Rev. 2 Unit ...
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... Allowed number of short circuits: <1000; time between short circuits: >1s. Power Semiconductors Symbol Conditions Symbol Conditions SKP02N120 Max. Value Unit 2.0 K/W 4.5 62 Value Unit min. typ. max. 1200 - - V 2.5 3.1 3.6 - 3.7 4.3 2.0 2 100 - - 100 nA 1 205 250 Rev. 2.2 Sep 07 ...
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... C j Symbol Conditions Energy losses include “tail” and diode reverse recovery SKP02N120 Value Unit min. typ. max 260 340 - 0.16 0. 0.06 0.08 - 0. 400 A/ s Value Unit min. typ. max 290 350 - 85 102 - 0.27 0. 0.11 0.15 - 0.38 0.48 ...
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... I c 10A 1A 0.1A 0.01A 1V 10kHz 100kHz V Figure 2. Safe operating area ( 25°C 100°C 125°C Figure 4. Collector current as a function of case temperature ( SKP02N120 150 s 500 s 20ms DC 10V 100V 1000V , - COLLECTOR EMITTER VOLTAGE 150 50°C 75°C 100°C 125° CASE TEMPERATURE C ...
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... Power Semiconductors Figure 6. Typical output characteristics (T = 150 11V -50°C T Figure 8. Typical collector-emitter saturation voltage as a function of junction temperature (V = 15V SKP02N120 =17V GE 15V 13V 11V COLLECTOR EMITTER VOLTAGE =1A C 0°C 50°C 100°C 150°C , JUNCTION TEMPERATURE j Rev. 2.2 Sep 07 7V ...
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... Figure 10. Typical switching times as a function of gate resistor (inductive load 800V dynamic test circuit in Fig. 100°C 150°C -50°C Figure 12. Gate-emitter threshold voltage as a function of junction temperature (I = 0.3mA SKP02N120 t d(off d(on 100 150 R , GATE RESISTOR G = 150 +15V/0V 2A max. typ. min. 0°C 50° ...
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... Fig K K/W E off -2 10 K/W 100°C 150°C 1µs Figure 16. IGBT transient thermal impedance as a function of pulse width ( SKP02N120 *) E and E include losses on ts due to diode recovery. 50 100 150 R , GATE RESISTOR G = 150 +15V/0V 2A D=0.5 0.2 0.1 0. 0.66735 0.04691 ...
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... V Figure 18. Typical capacitance as a function of collector-emitter voltage (V GE 40A 30A 20A 10A 0A 14V 15V 10V Figure 20. Typical short circuit collector current as a function of gate-emitter voltage (100V V 8 SKP02N120 10V 20V 30V , - COLLECTOR EMITTER VOLTAGE 1MHz) 12V 14V 16V 18V GATE ...
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... Fig.E ) 400A =2A F 300A/ s 200A/ s 100A/ s 0A/ s 100A/ s 400A Figure 24. Typical diode peak rate of fall of reverse recovery current as a function of diode current slope (V = 800V dynamic test circuit in Fig SKP02N120 I = =1A F 200A/ s 300A/ s 400A DIODE CURRENT SLOPE = 150 = =2A F 200A/ s ...
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... T) p Power Semiconductors 3.0V 2.5V 2.0V 1.5V T =25°C J 1.0V 0.5V 0. 0°C Figure 26. Typical diode forward voltage as a function of junction temperature , ( s ) 0.38953 0.04664 0.00473 0.00066 10ms 100ms 1s 10 SKP02N120 =1A F 40°C 80°C 120° JUNCTION TEMPERATURE j Rev. 2.2 Sep 07 ...
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... Power Semiconductors PG-TO220-3-1 11 SKP02N120 Rev. 2.2 Sep 07 ...
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... Figure A. Definition of switching times Figure B. Definition of switching losses Power Semiconductors SKP02N120 i Figure C. Definition of diodes switching characteristics ( Figure D. Thermal equivalent circuit Figure E. Dynamic test circuit Leakage inductance L =180nH, and stray capacity C =40pF Rev. 2.2 Sep 07 ...
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... Life support devices or systems are intended to be implanted in the human body support and/or maintain and sustain and/or protect human life. If they fail reasonable to assume that the health of the user or other persons may be endangered. Power Semiconductors SKP02N120 13 Rev. 2.2 Sep 07 ...